Location: San Antonio , United States
Conference dates: 5/1/2023 - 5/5/2023
| Discipline name | Position | Best Scientists | Publications | D-Index |
|---|---|---|---|---|
| Electronics and Electrical Engineering | 52 | 122 | 350 | 15 |
This comprehensive ranking presents a curated list of scientific conferences within the field of Engineering and Technology. Developed by Research.com, a prominent resource renowned since 2014 for delivering trusted data on scientific achievements across all major disciplines, the ranking aims to guide researchers, academics, and professionals in identifying leading venues for scholarly contribution and engagement.
The ranking methodology employed by Research.com utilizes a proprietary bibliometric score, specifically devised to ensure an objective and thorough assessment of conference influence and academic relevance. The position of each conference in this listing is determined by a unique score that integrates key factors: the estimated h-index of the conference and the number of leading scientists who have participated in the conference during the previous three years. This dual-metric approach ensures both the academic impact and the caliber of contributors are rigorously evaluated.
Impact Score values were assembled on 2024-11-27, ensuring that the ranking reflects the most recent data available. The selection and ranking process was extensive, encompassing an examination of more than 2,262 conferences. These conferences were meticulously chosen following a detailed analysis of over 26,934 scientific documents published within the last three years by 9,385 eminent and respected scientists specializing in Engineering and Technology. This depth of analysis highlights the commitment to accuracy and excellence championed by Research.com experts.
To understand the full complexity of the bibliometric calculations and decision criteria underpinning this ranking, readers are invited to consult the detailed explanation available on our Methodology Page.
A key indicator for each conference is its effectiveness in reaching other researchers with the papers published at that venue.
The chart below presents the interquartile range (first quartile 25%, median 50% and third quartile 75%) of the number of citations of articles over time.
The top authors publishing at IEEE Radar Conference (based on the number of publications) are:
The overall trend for top authors publishing at this conference is outlined below. The chart shows the number of publications at each edition of the conference for top authors.
Only papers with recognized affiliations are considered
The top affiliations publishing at IEEE Radar Conference (based on the number of publications) are:
The overall trend for top affiliations publishing at this conference is outlined below. The chart shows the number of publications at each edition of the conference for top affiliations.
The publication chance index shows the ratio of articles published by the best research institutions at the conference edition to all articles published within that conference. The best research institutions were selected based on the largest number of articles published during all editions of the conference.
The chart below presents the percentage ratio of articles from top institutions (based on their ranking of total papers).Top affiliations were grouped by their rank into the following tiers: top 1-10, top 11-20, top 21-50, and top 51+. Only articles with a recognized affiliation are considered.
During the most recent 2015 edition, 9.69% of publications had an unrecognized affiliation. Out of the publications with recognized affiliations, 36.91% were posted by at least one author from the top 10 institutions publishing at the conference. Another 13.61% included authors affiliated with research institutions from the top 11-20 affiliations. Institutions from the 21-50 range included 21.73% of all publications and 27.75% were from other institutions.
A very common phenomenon observed among researchers publishing scientific articles is the intentional selection of conferences they have already attended in the past. In particular, it is worth analyzing the case when the authors participate in the same conference from year to year.
The Returning Authors Index presented below illustrates the ratio of authors who participated in both a given as well as the previous edition of the conference in relation to all participants in a given year.
The graph below shows the Returning Institution Index, illustrating the ratio of institutions that participated in both a given and the previous edition of the conference in relation to all affiliations present in a given year.
Our experience to innovation index was created to show a cross-section of the experience level of authors publishing at a conference. The index includes the authors publishing at the last edition of a conference, grouped by total number of publications throughout their academic career (P) and the total number of citations of these publications ever received (C).
The group intervals were selected empirically to best show the diversity of the authors' experiences, their labels were selected as a convenience, not as judgment. The authors were divided into the following groups:
The chart below illustrates experience levels of first authors in cases of publications with multiple authors.
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University of Kansas
Imec
University of Birmingham
Villanova University
University of Electronic Science and Technology of China
United States Air Force Research Laboratory
University of Naples Federico II
University of Electronic Science and Technology of China
Weizmann Institute of Science
University of Ulm
Finmeccanica (Italy)
United States Air Force Research Laboratory
