World's Best Scientists 2026 revealed!
IEEE

ANNUAL IEEE INTERNATIONAL CONFERENCE ON ELECTRO INFORMATION TECHNOLOGY (EIT)

Location: Romeoville, IL , United States

Submission deadline: 3/7/2023

Conference dates: 5/18/2023 - 5/20/2023

Research H-index
5

Ranking & Metrics

Discipline name Position Best Scientists Publications D-Index
Electronics and Electrical Engineering 566 4 10 4

Call for Papers

Topics of interest include but are not limited to:

Robotics and Mechatronics
Intelligent Systems and Multi-agent Systems
Control Systems and System Identification
Reconfigurable and Embedded Systems
Power Systems and Power Electronics
Solid State, Consumer and Automotive Electronics
Electronic Design Automation
Biomedical Applications, Telemedicine
Biometrics and Bioinformatics
Nanotechnology
Micro Electromechanical Systems
Wireless communications and Networking
Ad Hoc and Sensor Networks
Cyber Security
Computer Vision
Signal/Image and Video Processing
Distributed Data Fusion and Mining
Cloud, Mobile, and Distributed Computing
Software Engineering and Middleware Architecture
Engineering Education

Overview

This comprehensive ranking showcases leading scientific conferences in the field of Electronics and Electrical Engineering, meticulously evaluated and compiled by Research.com, a recognized authority in science research across all major fields since 2014. Renowned for providing reliable and up-to-date data on scientific contributions, Research.com serves as a trusted resource for the global academic community.

The ranking is based on an exclusive bibliometric score developed by Research.com, offering an objective measure of conference influence and scholarly significance. This unique score is calculated using both the estimated h-index and the count of prominent scientists who have actively contributed to the conference over the most recent three-year period. The current ranking utilizes the latest Impact Score values, collected on 2024-11-27, ensuring timely and relevant insights.

To ensure the highest standard of accuracy and authority, the ranking process entailed a thorough examination of over 2,204 conferences. These were selected following detailed scrutiny and rigorous evaluation of more than 95,378 scientific papers published within the last three years by 6,160 distinguished and respected scientists specializing in Electronics and Electrical Engineering.

This careful and exhaustive analysis by domain experts underscores the depth and complexity involved in generating the conference rankings, providing researchers, academicians, and professionals with a reliable tool for identifying key venues for scholarly exchange and dissemination.

For an in-depth explanation of the methodologies and criteria applied in computing the ranking scores, please visit our Methodology Page.

Papers citation over time

A key indicator for each conference is its effectiveness in reaching other researchers with the papers published at that venue.

The chart below presents the interquartile range (first quartile 25%, median 50% and third quartile 75%) of the number of citations of articles over time.

The top authors publishing at Electro/Information Technology (based on the number of publications) are:

  • Jafar Saniie (28 papers) published 6 papers at the last edition the same number as at the previous edition,
  • Erdal Oruklu (21 papers) published 4 papers at the last edition, 1 more than at the previous edition,
  • Ezzatollah Salari (12 papers) published 2 papers at the last edition the same number as at the previous edition,
  • Ken Choi (11 papers) absent at the last edition,
  • Ibrahim Abdel-Motaleb (10 papers) published 3 papers at the last edition the same number as at the previous edition.

The overall trend for top authors publishing at this conference is outlined below. The chart shows the number of publications at each edition of the conference for top authors.

Only papers with recognized affiliations are considered

The top affiliations publishing at Electro/Information Technology (based on the number of publications) are:

  • Illinois Institute of Technology (67 papers) published 15 papers at the last edition, 5 more than at the previous edition,
  • Iowa State University (38 papers) published 2 papers at the last edition, 1 more than at the previous edition,
  • University of North Dakota (35 papers) published 13 papers at the last edition, 10 more than at the previous edition,
  • University of Toledo (35 papers) published 3 papers at the last edition, 4 less than at the previous edition,
  • University of Windsor (26 papers) absent at the last edition.

The overall trend for top affiliations publishing at this conference is outlined below. The chart shows the number of publications at each edition of the conference for top affiliations.

Publication chance based on affiliation

The publication chance index shows the ratio of articles published by the best research institutions at the conference edition to all articles published within that conference. The best research institutions were selected based on the largest number of articles published during all editions of the conference.

The chart below presents the percentage ratio of articles from top institutions (based on their ranking of total papers).Top affiliations were grouped by their rank into the following tiers: top 1-10, top 11-20, top 21-50, and top 51+. Only articles with a recognized affiliation are considered.

During the most recent 2015 edition, 4.72% of publications had an unrecognized affiliation. Out of the publications with recognized affiliations, 42.15% were posted by at least one author from the top 10 institutions publishing at the conference. Another 10.74% included authors affiliated with research institutions from the top 11-20 affiliations. Institutions from the 21-50 range included 15.70% of all publications and 31.40% were from other institutions.

Returning Authors Index

A very common phenomenon observed among researchers publishing scientific articles is the intentional selection of conferences they have already attended in the past. In particular, it is worth analyzing the case when the authors participate in the same conference from year to year.

The Returning Authors Index presented below illustrates the ratio of authors who participated in both a given as well as the previous edition of the conference in relation to all participants in a given year.

Returning Institution Index

The graph below shows the Returning Institution Index, illustrating the ratio of institutions that participated in both a given and the previous edition of the conference in relation to all affiliations present in a given year.

The experience to innovation index

Our experience to innovation index was created to show a cross-section of the experience level of authors publishing at a conference. The index includes the authors publishing at the last edition of a conference, grouped by total number of publications throughout their academic career (P) and the total number of citations of these publications ever received (C).

The group intervals were selected empirically to best show the diversity of the authors' experiences, their labels were selected as a convenience, not as judgment. The authors were divided into the following groups:

  • Novice - P < 5 or C < 25 (the number of publications less than 5 or the number of citations less than 25),
  • Competent - P < 10 or C < 100 (the number of publications less than 10 or the number of citations less than 100),
  • Experienced - P < 25 or C < 625 (the number of publications less than 25 or the number of citations less than 625),
  • Master - P < 50 or C < 2500 (the number of publications less than 50 or the number of citations less than 2500),
  • Star - P ≥ 50 and C ≥ 2500 (both the number of publications greater than 50 and the number of citations greater than 2500).

The chart below illustrates experience levels of first authors in cases of publications with multiple authors.

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