World's Best Scientists 2026 revealed!
IEEE

26th IEEE Workshop on Signal and Power Integrity (SPI)

Location: Siegen , Germany

Conference dates: 5/22/2022 - 5/25/2022

Research H-index
4

Ranking & Metrics

Discipline name Position Best Scientists Publications D-Index
Electronics and Electrical Engineering 529 13 15 4

Call for Papers

The Technical Program Committee (TPC) is seeking original and unpublished contributions on all aspects of Signal and Power Integrity. Detailed instructions for manuscript submission are available here. All contributions will be subjected to a rigorous review process, conducted by the TPC. Accepted papers will be included in the conference program and will be submitted for inclusion into IEEE Xplore subject to meeting IEEE Xplore’s scope and quality requirements.

Topics of Interest:
Modeling and simulation for SI/PI
Coupled signal and power Integrity analysis
Noise reduction and equalization techniques
High-speed link design and modeling
Power distribution networks
RF/microwave/mm-wave systems and packaging solutions
Antennas-in-package and antennas-on-chip
3D IC and packages (TSV/SiP/SoC)
Nano-interconnects and nano-structures
Electromagnetic theory and modeling
Transmission line theory and modeling
Macromodeling, reduced order models
Electromagnetic compatibility
Design methodology/flow measurements
Jitter and noise modeling
Stochastic/sensitivity analysis
Electro-thermal modeling
Chip-package co-design
Novel CAD concepts
Optical interconnects
AI in electronics design

Overview

This ranking provides a comprehensive assessment of scientific conferences within the field of Electronics and Electrical Engineering. Prepared by Research.com—one of the leading websites specializing in data-driven insights for scientific research across all major disciplines—this listing leverages a rigorous, credible approach to evaluating scientific contributions, building on a foundation of trusted data since 2014.

The ranking positions are determined based on a unique bibliometric score developed by Research.com. This score integrates an estimated h-index and the number of leading scientists who participated in each conference over the preceding three years, offering a robust indicator of a conference's scientific impact and influence within the scholarly community. Notably, the Impact Score values included in the ranking were gathered as of 2024-11-27, ensuring the most current and relevant data are used in the evaluation process.

The methodology for compiling this ranking entailed a meticulous examination of more than 2,204 conferences, which were carefully selected following the rigorous analysis of over 95,378 scientific documents published in the last three years. These documents are the work of 6,160 leading and well-respected scientists contributing to advancements in Electronics and Electrical Engineering. This extensive analysis underscores the depth and objectivity embedded in the creation of the ranking.

For further information on the methodology used to compute the ranking scores, including detailed explanations of the scoring formula, source selection, and validation processes, please visit our Methodology Page.

Papers citation over time

A key indicator for each conference is its effectiveness in reaching other researchers with the papers published at that venue.

The chart below presents the interquartile range (first quartile 25%, median 50% and third quartile 75%) of the number of citations of articles over time.

The top authors publishing at IEEE Workshop on Signal and Power Integrity (based on the number of publications) are:

  • Christian Schuster (23 papers) published 2 papers at the last edition the same number as at the previous edition,
  • Tom Dhaene (15 papers) absent at the last edition,
  • Antonio Maffucci (13 papers) published 2 papers at the last edition,
  • Flavio Canavero (12 papers) published 1 paper at the last edition the same number as at the previous edition,
  • Paolo Manfredi (12 papers) published 1 paper at the last edition.

The overall trend for top authors publishing at this conference is outlined below. The chart shows the number of publications at each edition of the conference for top authors.

Only papers with recognized affiliations are considered

The top affiliations publishing at IEEE Workshop on Signal and Power Integrity (based on the number of publications) are:

  • Ghent University (26 papers) absent at the last edition,
  • Polytechnic University of Turin (22 papers) published 3 papers at the last edition, 2 more than at the previous edition,
  • Intel (18 papers) published 3 papers at the last edition,
  • STMicroelectronics (18 papers) absent at the last edition,
  • Carleton University (15 papers) published 1 paper at the last edition, 1 less than at the previous edition.

The overall trend for top affiliations publishing at this conference is outlined below. The chart shows the number of publications at each edition of the conference for top affiliations.

Publication chance based on affiliation

The publication chance index shows the ratio of articles published by the best research institutions at the conference edition to all articles published within that conference. The best research institutions were selected based on the largest number of articles published during all editions of the conference.

The chart below presents the percentage ratio of articles from top institutions (based on their ranking of total papers).Top affiliations were grouped by their rank into the following tiers: top 1-10, top 11-20, top 21-50, and top 51+. Only articles with a recognized affiliation are considered.

During the most recent 2021 edition, 4.00% of publications had an unrecognized affiliation. Out of the publications with recognized affiliations, 54.17% were posted by at least one author from the top 10 institutions publishing at the conference. Another 8.33% included authors affiliated with research institutions from the top 11-20 affiliations. Institutions from the 21-50 range included 4.17% of all publications and 33.33% were from other institutions.

Returning Authors Index

A very common phenomenon observed among researchers publishing scientific articles is the intentional selection of conferences they have already attended in the past. In particular, it is worth analyzing the case when the authors participate in the same conference from year to year.

The Returning Authors Index presented below illustrates the ratio of authors who participated in both a given as well as the previous edition of the conference in relation to all participants in a given year.

Returning Institution Index

The graph below shows the Returning Institution Index, illustrating the ratio of institutions that participated in both a given and the previous edition of the conference in relation to all affiliations present in a given year.

The experience to innovation index

Our experience to innovation index was created to show a cross-section of the experience level of authors publishing at a conference. The index includes the authors publishing at the last edition of a conference, grouped by total number of publications throughout their academic career (P) and the total number of citations of these publications ever received (C).

The group intervals were selected empirically to best show the diversity of the authors' experiences, their labels were selected as a convenience, not as judgment. The authors were divided into the following groups:

  • Novice - P < 5 or C < 25 (the number of publications less than 5 or the number of citations less than 25),
  • Competent - P < 10 or C < 100 (the number of publications less than 10 or the number of citations less than 100),
  • Experienced - P < 25 or C < 625 (the number of publications less than 25 or the number of citations less than 625),
  • Master - P < 50 or C < 2500 (the number of publications less than 50 or the number of citations less than 2500),
  • Star - P ≥ 50 and C ≥ 2500 (both the number of publications greater than 50 and the number of citations greater than 2500).

The chart below illustrates experience levels of first authors in cases of publications with multiple authors.

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