1598-1657
Published by: Institute of Electronics, Information and Communication Engineers
| Discipline name | Position | Best Scientists | Publications | D-Index |
|---|---|---|---|---|
| Electronics and Electrical Engineering | 443 | 14 | 28 | 5 |
The journal focuses largely on the fields of Electronic engineering, Optoelectronics, Electrical engineering, CMOS and Voltage. In the journal, Power (physics), Electronic circuit, Chip and Phase-locked loop are investigated in conjunction with one another to address concerns in Electronic engineering research. Journal of Semiconductor Technology and Science focuses on Optoelectronics but the discussions also offer insight into other areas such as Threshold voltage, Transistor, MOSFET and Field-effect transistor.
Discussions in the journal are anchored in the subject of Electrical engineering and the similar topic of Capacitance.
The journal publications mainly deal with areas of study such as Optoelectronics, Electronic engineering, Electrical engineering, MOSFET and CMOS. While Optoelectronics is the focus of the most cited publications, it also provides insights into the studies of Transistor and Voltage. The most cited papers focus on Electrical engineering but the discussions also offer insight into other areas such as Power (physics) and Doping.
The main research concerns discussed in the journal are Optoelectronics, Electronic engineering, Power (physics), Electrical engineering and CMOS. Journal of Semiconductor Technology and Science explores research in Optoelectronics alongside concepts in Electrostatic discharge protection and other areas of study in Bipolar junction transistor and Silicon-controlled rectifier. The works on Electronic engineering deal in particular with Cmos process.
The subject of Chip, which is connected to the field of Nuclear engineering and Heat transfer model, serves as the foundation of the Power (physics) research featured in the journal. The journal discusses concepts in Biasing, Offset cancellation and Integrated circuit under Electrical engineering and how they intertwine with disciplines like Variable (computer science). Low-pass filter, Adder, Hysteresis, Radar systems and Analytical chemistry are some topics wherein CMOS research discussed in it have an impact.
A key indicator for each journal is its effectiveness in reaching other researchers with the papers published at that venue.
The chart below presents the interquartile range (first quartile 25%, median 50% and third quartile 75%) of the number of citations of articles over time.
The top authors publishing in Journal of Semiconductor Technology and Science (based on the number of publications) are:
The overall trend for top authors publishing in this journal is outlined below. The chart shows the number of publications at each edition of the journal for top authors.
Only papers with recognized affiliations are considered
The top affiliations publishing in Journal of Semiconductor Technology and Science (based on the number of publications) are:
The overall trend for top affiliations publishing in this journal is outlined below. The chart shows the number of publications at each edition of the journal for top affiliations.
The publication chance index shows the ratio of articles published by the best research institutions in the journal edition to all articles published within that journal. The best research institutions were selected based on the largest number of articles published during all editions of the journal.
The chart below presents the percentage ratio of articles from top institutions (based on their ranking of total papers).Top affiliations were grouped by their rank into the following tiers: top 1-10, top 11-20, top 21-50, and top 51+. Only articles with a recognized affiliation are considered.
During the most recent 2021 edition, 100.00% of publications had an unrecognized affiliation. Out of the publications with recognized affiliations, nan% were posted by at least one author from the top 10 institutions publishing in the journal. Another nan% included authors affiliated with research institutions from the top 11-20 affiliations. Institutions from the 21-50 range included nan% of all publications and nan% were from other institutions.
A very common phenomenon observed among researchers publishing scientific articles is the intentional selection of journals they have already attended in the past. In particular, it is worth analyzing the case when the authors participate in the same journal from year to year.
The Returning Authors Index presented below illustrates the ratio of authors who participated in both a given as well as the previous edition of the journal in relation to all participants in a given year.
The graph below shows the Returning Institution Index, illustrating the ratio of institutions that participated in both a given and the previous edition of the conference in relation to all affiliations present in a given year.
Our experience to innovation index was created to show a cross-section of the experience level of authors publishing in a journal. The index includes the authors publishing at the last edition of a journal, grouped by total number of publications throughout their academic career (P) and the total number of citations of these publications ever received (C).
The group intervals were selected empirically to best show the diversity of the authors' experiences, their labels were selected as a convenience, not as judgment. The authors were divided into the following groups:
The chart below illustrates experience levels of first authors in cases of publications with multiple authors.
Dipjyoti Das;Venkateswarlu Gaddam;Sanghun Jeon
(2021)Suhyeon Kim;Myung-Hyun Baek;Sungmin Hwang;Taejin Jang
(2020)Dongkyu Jang;Gyuweon Jung;Yujeong Jeong;Seongbin Hong
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