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IEEE Industry Applications Magazine
H-index 8

IEEE Industry Applications Magazine

Ranking & Metrics

Discipline name Position Best Scientists Publications D-Index
Electronics and Electrical Engineering 355 37 105 8

Additional Metrics

Number of Best Scientists*: 48
Documents by Best Scientists*: 109
Top 100 Ranked Scientists*: 0
SCIMAGO H-index: 62
SCIMAGO SJR: 0.269
Impact Factor: N/A

Overview

Top Research Topics at IEEE Industry Applications Magazine?

The journal investigates areas of study like Electrical engineering, Reliability engineering, Electric power system, Automotive engineering and Control engineering. The journal focuses on Electrical engineering but the discussions also offer insight into other areas such as Power-system protection and Electronic engineering. Maintenance engineering is a major topic of Reliability engineering research.

IEEE Industry Applications Magazine features Automotive engineering research that overlaps with concepts in Electric motor. The journal connects research in Control engineering with the related topic of Induction motor.

  • Electrical engineering (21.67%)
  • Reliability engineering (11.45%)
  • Electric power system (8.17%)

What are the most cited papers published in the journal?

  • Doubly fed induction generator systems for wind turbines (1515 citations)
  • Current signature analysis to detect induction motor faults (901 citations)
  • Application issues of active power filters (454 citations)

Research areas of the most cited articles at IEEE Industry Applications Magazine:

The journal articles investigate studies in Electrical engineering, Electronic engineering, Control engineering, Control theory and Automotive engineering. The journal publications with studies in Electrical engineering featured incorporate elements of Electric power system and Range (aeronautics). The works on Electronic engineering tackled in the most cited papers bring together disciplines like Power factor, Harmonics, Active filter, Filter (video) and Harmonic.

What topics the last edition of the journal is best known for?

  • World War II
  • Electrical engineering
  • Law

The previous edition focused in particular on these issues:

The main research concerns discussed in IEEE Industry Applications Magazine are Reliability engineering, Electric power system, Management, Desk and Risk analysis (engineering). IEEE Industry Applications Magazine explores issues in Reliability engineering which can be linked to other research areas like Software deployment, Protective relay, Harmonic analysis, Switchgear and Ground. In addition to Electric power system research, the journal aims to explore topics under Upgrade, Circuit breaker, Control (management), Electric power and Transient (oscillation).

The Risk analysis (engineering) study featured in it draws connections with the study of Maintenance engineering.

The most cited articles from the last journal are:

  • The Experiences of a Global Electrical Manufacturing Enterprise: The Journey to Become Industry 4.0 Ready (2 citations)
  • Plotting Characteristic Curves of Photovoltaic Modules: A Simple and Portable Approach (1 citations)
  • Evaluation of Protection Systems in Electric Arc Furnaces: A Methodology for Assessment (1 citations)

Papers citation over time

A key indicator for each journal is its effectiveness in reaching other researchers with the papers published at that venue.

The chart below presents the interquartile range (first quartile 25%, median 50% and third quartile 75%) of the number of citations of articles over time.

The top authors publishing in IEEE Industry Applications Magazine (based on the number of publications) are:

  • Peter Magyar (54 papers) absent at the last edition,
  • Lanny Floyd (51 papers) absent at the last edition,
  • Mary Capelli-Schellpfeffer (48 papers) absent at the last edition,
  • Mark Halpin (36 papers) absent at the last edition,
  • Daleep Mohla (32 papers) published 6 papers at the last edition, 1 less than at the previous edition.

The overall trend for top authors publishing in this journal is outlined below. The chart shows the number of publications at each edition of the journal for top authors.

Only papers with recognized affiliations are considered

The top affiliations publishing in IEEE Industry Applications Magazine (based on the number of publications) are:

  • Rockwell Automation (42 papers) published 2 papers at the last edition, 1 less than at the previous edition,
  • Eaton Corporation (36 papers) published 2 papers at the last edition, 1 more than at the previous edition,
  • Wilmington University (25 papers) absent at the last edition,
  • Chevron Corporation (24 papers) published 1 paper at the last edition the same number as at the previous edition,
  • DuPont (23 papers) absent at the last edition.

The overall trend for top affiliations publishing in this journal is outlined below. The chart shows the number of publications at each edition of the journal for top affiliations.

Publication chance based on affiliation

The publication chance index shows the ratio of articles published by the best research institutions in the journal edition to all articles published within that journal. The best research institutions were selected based on the largest number of articles published during all editions of the journal.

The chart below presents the percentage ratio of articles from top institutions (based on their ranking of total papers).Top affiliations were grouped by their rank into the following tiers: top 1-10, top 11-20, top 21-50, and top 51+. Only articles with a recognized affiliation are considered.

During the most recent 2021 edition, 68.60% of publications had an unrecognized affiliation. Out of the publications with recognized affiliations, 14.81% were posted by at least one author from the top 10 institutions publishing in the journal. Another 7.41% included authors affiliated with research institutions from the top 11-20 affiliations. Institutions from the 21-50 range included 29.63% of all publications and 48.15% were from other institutions.

Returning Authors Index

A very common phenomenon observed among researchers publishing scientific articles is the intentional selection of journals they have already attended in the past. In particular, it is worth analyzing the case when the authors participate in the same journal from year to year.

The Returning Authors Index presented below illustrates the ratio of authors who participated in both a given as well as the previous edition of the journal in relation to all participants in a given year.

Returning Institution Index

The graph below shows the Returning Institution Index, illustrating the ratio of institutions that participated in both a given and the previous edition of the conference in relation to all affiliations present in a given year.

The experience to innovation index

Our experience to innovation index was created to show a cross-section of the experience level of authors publishing in a journal. The index includes the authors publishing at the last edition of a journal, grouped by total number of publications throughout their academic career (P) and the total number of citations of these publications ever received (C).

The group intervals were selected empirically to best show the diversity of the authors' experiences, their labels were selected as a convenience, not as judgment. The authors were divided into the following groups:

  • Novice - P < 5 or C < 25 (the number of publications less than 5 or the number of citations less than 25),
  • Competent - P < 10 or C < 100 (the number of publications less than 10 or the number of citations less than 100),
  • Experienced - P < 25 or C < 625 (the number of publications less than 25 or the number of citations less than 625),
  • Master - P < 50 or C < 2500 (the number of publications less than 50 or the number of citations less than 2500),
  • Star - P ≥ 50 and C ≥ 2500 (both the number of publications greater than 50 and the number of citations greater than 2500).

The chart below illustrates experience levels of first authors in cases of publications with multiple authors.

Top Publications

  • High-Speed Arcing Fault Detection: Using the Light Spectrum

    Long Zhao;Yuhao Zhou;Kun-Long Chen;Shiuan-Hau Rau

    (2020)
    36 Citations
  • Smart Sensor for Fault Detection in Induction Motors Based on the Combined Analysis of Stray-Flux and Current Signals: A Flexible, Robust Approach

    Israel Zamudio-Ramirez;Roque Alfredo Osornio-Rios;Jose Antonino-Daviu

    (2021)
    24 Citations
  • A Multicriteria Optimal Operation Framework for a Data Center Microgrid Considering Renewable Energy and Waste Heat Recovery: Use of Balanced Decision Making

    (2023)
    12 Citations
  • Determination of the Insulation Condition in Synchronous Generators: Industrial Methods and a Case Study

    Dimosthenis Verginadis;Jose Antonino-Daviu;Athanasios Karlis;Michael Danikas

    (2021)
    10 Citations
  • Second Life Batteries: Current Regulatory Framework, Evaluation Methods, and Economic Assessment: Reuse, refurbish, or recycle

    (2023)
    10 Citations
  • Cloud Platform-Oriented Electrical Vehicle Abnormal Battery Cell Detection and Pack Consistency Evaluation With Big Data: Devising an Early-Warning System for Latent Risks

    Peng Liu;Jin Wang;Zhenpo Wang;Zhaosheng Zhang

    (2021)
    9 Citations
  • Introduction to IEEE Standard 1584: Guide for Performing Arc-Flash Hazard Calculations, 2018 Edition

    Daleep Mohla;Wei-Jen Lee;Jim Phillips;Albert Marroquin

    (2020)
    9 Citations
  • The Formula SAE Electric Vehicle Competition: A High-Torque Density Permanent Magnet Motor

    Marco Munaro;Nicola Bianchi;Giovanni Meneghetti

    (2020)
    8 Citations
  • A Comprehensive Review of Permanent Magnet Transverse Flux Machines: Use in Direct-Drive Applications

    Tausif Husain;Iftekhar Hasan;Yilmaz Sozer;Iqbal Husain

    (2020)
    8 Citations
  • Magnetic Actuator Design for Strip Stabilizers in Hot-Dip Galvanizing Lines: Examining Rules and Basic Tradeoffs

    Lukas Marko;Martin Saxinger;Andreas Steinboeck;Andreas Kugi

    (2020)
    7 Citations

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