MDTS 2027 — 36th IEEE Microelectronics Design and Test Symposium (MDTS)

MDTS is an annual IEEE Region 1 symposium in Albany, New York, on the design and test of microelectronic circuits and systems. It invites original contributions on design for test, electronic design automation, yield analysis, hardware security, analog and mixed-signal design, AI in electronics, reliability. Submissions may take the form of full research papers, extended abstracts and poster presentations reporting theoretical, computational and experimental work, as well as industrial case studies and applications. The meeting brings together researchers, engineers, industry practitioners and students to exchange recent results and discuss emerging directions in the field. Accepted papers are published in the conference proceedings and submitted to IEEE Xplore.