20th ACM Conference on Embedded Networked Sensor Systems (SenSys 2022) (SenSys)

The conference ranking presented on this page comprehensively lists scientific conferences in the field of Engineering and Technology. This authoritative ranking has been meticulously prepared by Research.com, a prominent and trusted platform recognized for providing reliable, data-driven insights into scientific research and contributions across major disciplines since 2014, including Engineering and Technology.

Conference positions within this ranking are determined by a unique bibliometric score, an exclusive metric developed by Research.com. The score is calculated by integrating the estimated h-index with the number of leading scientists who have contributed to each conference over the last three years, thus reflecting both the impact and the scientific leadership present at each event. Impact Score values incorporated into this ranking were gathered as of 2024-11-27, ensuring the recency and relevance of the information.

The process of curating and ranking conferences involved an exhaustive analysis that began with a detailed selection of over 2,262 conferences. This selection stemmed from a rigorous examination of more than 26,934 scientific documents published in the last three years, authored by 9,385 distinguished and influential scientists in the sphere of Engineering and Technology. Such a thorough and expert-driven approach underscores the depth and comprehensiveness that characterize this ranking.

For an in-depth explanation of the methodology and metrics used to compute the ranking scores, please refer to our Methodology Page.

Papers citation over time

A key indicator for each conference is its effectiveness in reaching other researchers with the papers published at that venue.

The chart below presents the interquartile range (first quartile 25%, median 50% and third quartile 75%) of the number of citations of articles over time.

Top authors and change over time

The top authors publishing at International Conference on Embedded Networked Sensor Systems (based on the number of publications) are:

• Prabal Dutta (27 papers) published 5 papers at the last edition, 1 more than at the previous edition,
• Tian He (19 papers) published 2 papers at the last edition the same number as at the previous edition,
• John A. Stankovic (18 papers) published 2 papers at the last edition the same number as at the previous edition,
• Kamin Whitehouse (16 papers) absent at the last edition,
• Pei Zhang (14 papers) published 6 papers at the last edition, 3 more than at the previous edition.

The overall trend for top authors publishing at this conference is outlined below. The chart shows the number of publications at each edition of the conference for top authors.

Top affiliations and change over time

Only papers with recognized affiliations are considered

The top affiliations publishing at International Conference on Embedded Networked Sensor Systems (based on the number of publications) are:

• ETH Zurich (34 papers) published 4 papers at the last edition, 2 less than at the previous edition,
• University of Virginia (30 papers) published 2 papers at the last edition the same number as at the previous edition,
• Microsoft (28 papers) published 2 papers at the last edition, 1 more than at the previous edition,
• University of California, Berkeley (24 papers) published 2 papers at the last edition,
• Carnegie Mellon University (23 papers) published 8 papers at the last edition, 1 more than at the previous edition.

The overall trend for top affiliations publishing at this conference is outlined below. The chart shows the number of publications at each edition of the conference for top affiliations.

Publication chance based on affiliation

The publication chance index shows the ratio of articles published by the best research institutions at the conference edition to all articles published within that conference. The best research institutions were selected based on the largest number of articles published during all editions of the conference.

The chart below presents the percentage ratio of articles from top institutions (based on their ranking of total papers).Top affiliations were grouped by their rank into the following tiers: top 1-10, top 11-20, top 21-50, and top 51+. Only articles with a recognized affiliation are considered.

During the most recent 2016 edition, 0.00% of publications had an unrecognized affiliation. Out of the publications with recognized affiliations, 42.25% were posted by at least one author from the top 10 institutions publishing at the conference. Another 1.41% included authors affiliated with research institutions from the top 11-20 affiliations. Institutions from the 21-50 range included 28.17% of all publications and 28.17% were from other institutions.

Returning Authors Index

A very common phenomenon observed among researchers publishing scientific articles is the intentional selection of conferences they have already attended in the past. In particular, it is worth analyzing the case when the authors participate in the same conference from year to year.

The Returning Authors Index presented below illustrates the ratio of authors who participated in both a given as well as the previous edition of the conference in relation to all participants in a given year.

Returning Institution Index

The graph below shows the Returning Institution Index, illustrating the ratio of institutions that participated in both a given and the previous edition of the conference in relation to all affiliations present in a given year.

The experience to innovation index

Our experience to innovation index was created to show a cross-section of the experience level of authors publishing at a conference. The index includes the authors publishing at the last edition of a conference, grouped by total number of publications throughout their academic career (P) and the total number of citations of these publications ever received (C).

The group intervals were selected empirically to best show the diversity of the authors' experiences, their labels were selected as a convenience, not as judgment. The authors were divided into the following groups:

• Novice - P < 5 or C < 25 (the number of publications less than 5 or the number of citations less than 25),
• Competent - P < 10 or C < 100 (the number of publications less than 10 or the number of citations less than 100),
• Experienced - P < 25 or C < 625 (the number of publications less than 25 or the number of citations less than 625),
• Master - P < 50 or C < 2500 (the number of publications less than 50 or the number of citations less than 2500),
• Star - P ≥ 50 and C ≥ 2500 (both the number of publications greater than 50 and the number of citations greater than 2500).

The chart below illustrates experience levels of first authors in cases of publications with multiple authors.