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Journal of Electron Spectroscopy and Related Phenomena
H-index 12

Journal of Electron Spectroscopy and Related Phenomena

Ranking & Metrics

Discipline name Position Best Scientists Publications D-Index
Physics 281 9 11 4
Chemistry 646 55 50 11

Additional Metrics

Number of Best Scientists*: 112
Documents by Best Scientists*: 90
Top 100 Ranked Scientists*: 4
SCIMAGO H-index: 106
SCIMAGO SJR: 0.601
Impact Factor: 1.5

Overview

Top Research Topics at Journal of Electron Spectroscopy and Related Phenomena?

Journal of Electron Spectroscopy and Related Phenomena mainly deals with areas of study such as Atomic physics, Analytical chemistry, Spectral line, X-ray photoelectron spectroscopy and Electron. Atomic physics research featured in Journal of Electron Spectroscopy and Related Phenomena incorporates concerns from various other topics such as Spectroscopy, Ionization and Excitation. Journal of Electron Spectroscopy and Related Phenomena is mostly focused on Ionization, specifically Photoionization.

While Analytical chemistry is the focus of Journal of Electron Spectroscopy and Related Phenomena, it also provided insights into the studies of Ion, Thin film and Adsorption. The concepts on Spectral line presented in the journal can also apply to other research fields, including Crystallography, Valence (chemistry), Molecular physics, Electronic structure and Molecule. The journal explores issues in X-ray photoelectron spectroscopy which can be linked to other research areas like Inorganic chemistry, X-ray, Metal and Binding energy.

The Electron study featured in it draws parallels with the field of Scattering. It links adjacent topics like Auger with Auger electron spectroscopy. The research on Photoemission spectroscopy discussed in the journal draws on the closely related field of Angle-resolved photoemission spectroscopy.

  • Atomic physics (40.60%)
  • Analytical chemistry (27.06%)
  • Spectral line (24.92%)

What are the most cited papers published in the journal?

  • Hartree-Slater subshell photoionization cross-sections at 1254 and 1487 eV. (4402 citations)
  • Determination of the V2p XPS binding energies for different vanadium oxidation states (V5+ to V0+) (1001 citations)
  • Handbook of He(I) photoelectron spectra of fundamental organic molecules : K. Kimura, S. Katsumata, Y. Achiba, T. Yamazaki and S. Iwata, 1981, Japan Scientific Societies Press, Tokyo, ISBN 4-7622-0263-X and Halsted Press, New York, 268 pp., US $44.95, ISBN 0-470-27200-7. (830 citations)

Research areas of the most cited articles at Journal of Electron Spectroscopy and Related Phenomena:

The main points discussed in the journal articles deal with Atomic physics, X-ray photoelectron spectroscopy, Analytical chemistry, Spectral line and Electron. The journal articles explore issues in Atomic physics which can be linked to other research areas like Valence (chemistry), Spectroscopy and Ionization, Photoionization. The most cited publications address concerns in X-ray photoelectron spectroscopy which are intertwined with other disciplines, such as Inorganic chemistry, Crystallography, Oxide and Binding energy.

What topics the last edition of the journal is best known for?

  • Quantum mechanics
  • Electron
  • Organic chemistry

The previous edition focused in particular on these issues:

Journal of Electron Spectroscopy and Related Phenomena is mainly concerned with subjects like X-ray photoelectron spectroscopy, Atomic physics, Spectral line, Analytical chemistry and Electron. The X-ray photoelectron spectroscopy works featured in it incorporate elements from Thin film, X-ray, Ionization energy, Copper and Ion. It facilitates discussions on Atomic physics that incorporate concepts from other fields like Ionization, Photoionization and Photoelectric effect.

The studies in Spectral line featured incorporate elements of Resonance, Physical chemistry, Excited state, Auger electron spectroscopy and Binding energy. In Journal of Electron Spectroscopy and Related Phenomena, Spectroscopy, Band gap and Emission spectrum are investigated in conjunction with one another to address concerns in Analytical chemistry research. The Electron works featured in the journal incorporate elements from Molecule, Molecular physics, Quantum and Scattering.

The most cited articles from the last journal are:

  • The CoESCA station at BESSY: Auger electron-Photoelectron coincidences from surfaces demonstrated for Ag MNN (2 citations)
  • 2p x-ray absorption spectroscopy of 3d transition metal systems (2 citations)
  • Application of near-ambient pressure X-ray photoelectron spectroscopy (NAP-XPS) in an in-situ analysis of the stability of the surface-supported metal-organic framework HKUST-1 in water, methanol and pyridine atmospheres (2 citations)

Papers citation over time

A key indicator for each journal is its effectiveness in reaching other researchers with the papers published at that venue.

The chart below presents the interquartile range (first quartile 25%, median 50% and third quartile 75%) of the number of citations of articles over time.

The top authors publishing in Journal of Electron Spectroscopy and Related Phenomena (based on the number of publications) are:

  • C.E. Brion (71 papers) absent at the last edition,
  • Shigemasa Suga (67 papers) absent at the last edition,
  • Adam P. Hitchcock (58 papers) absent at the last edition,
  • Shik Shin (56 papers) published 1 paper at the last edition,
  • Masaki Taniguchi (55 papers) absent at the last edition.

The overall trend for top authors publishing in this journal is outlined below. The chart shows the number of publications at each edition of the journal for top authors.

Only papers with recognized affiliations are considered

The top affiliations publishing in Journal of Electron Spectroscopy and Related Phenomena (based on the number of publications) are:

  • University of Tokyo (329 papers) published 4 papers at the last edition, 3 more than at the previous edition,
  • Tohoku University (237 papers) published 2 papers at the last edition,
  • Uppsala University (202 papers) published 2 papers at the last edition,
  • Lawrence Berkeley National Laboratory (196 papers) published 2 papers at the last edition, 1 more than at the previous edition,
  • Russian Academy of Sciences (176 papers) published 1 paper at the last edition.

The overall trend for top affiliations publishing in this journal is outlined below. The chart shows the number of publications at each edition of the journal for top affiliations.

Publication chance based on affiliation

The publication chance index shows the ratio of articles published by the best research institutions in the journal edition to all articles published within that journal. The best research institutions were selected based on the largest number of articles published during all editions of the journal.

The chart below presents the percentage ratio of articles from top institutions (based on their ranking of total papers).Top affiliations were grouped by their rank into the following tiers: top 1-10, top 11-20, top 21-50, and top 51+. Only articles with a recognized affiliation are considered.

During the most recent 2021 edition, 8.62% of publications had an unrecognized affiliation. Out of the publications with recognized affiliations, 22.64% were posted by at least one author from the top 10 institutions publishing in the journal. Another 7.55% included authors affiliated with research institutions from the top 11-20 affiliations. Institutions from the 21-50 range included 3.77% of all publications and 66.04% were from other institutions.

Returning Authors Index

A very common phenomenon observed among researchers publishing scientific articles is the intentional selection of journals they have already attended in the past. In particular, it is worth analyzing the case when the authors participate in the same journal from year to year.

The Returning Authors Index presented below illustrates the ratio of authors who participated in both a given as well as the previous edition of the journal in relation to all participants in a given year.

Returning Institution Index

The graph below shows the Returning Institution Index, illustrating the ratio of institutions that participated in both a given and the previous edition of the conference in relation to all affiliations present in a given year.

The experience to innovation index

Our experience to innovation index was created to show a cross-section of the experience level of authors publishing in a journal. The index includes the authors publishing at the last edition of a journal, grouped by total number of publications throughout their academic career (P) and the total number of citations of these publications ever received (C).

The group intervals were selected empirically to best show the diversity of the authors' experiences, their labels were selected as a convenience, not as judgment. The authors were divided into the following groups:

  • Novice - P < 5 or C < 25 (the number of publications less than 5 or the number of citations less than 25),
  • Competent - P < 10 or C < 100 (the number of publications less than 10 or the number of citations less than 100),
  • Experienced - P < 25 or C < 625 (the number of publications less than 25 or the number of citations less than 625),
  • Master - P < 50 or C < 2500 (the number of publications less than 50 or the number of citations less than 2500),
  • Star - P ≥ 50 and C ≥ 2500 (both the number of publications greater than 50 and the number of citations greater than 2500).

The chart below illustrates experience levels of first authors in cases of publications with multiple authors.

Top Publications

  • 2p x-ray absorption spectroscopy of 3d transition metal systems

    Frank M.F. de Groot;Hebatalla Elnaggar;Federica Frati;Ru-pan Wang

    (2021)
    74 Citations
  • Tailoring the structural, electronic structure and optical properties of Fe: SnO2 nanoparticles

    Shalendra Kumar;Shalendra Kumar;Mayuri Sharma;Rezq Naji Aljawfi;K.H. Chae

    (2020)
    45 Citations
  • Analysis of X-ray images and spectra (aXis2000): A toolkit for the analysis of X-ray spectromicroscopy data

    (2023)
    38 Citations
  • XPS fast depth profile of the native oxide layers on AISI 304, 316 and 430 commercial stainless steels and their evolution with time

    Simon Detriche;Sebastien Vivegnis;Sebastien Vivegnis;Sebastien Vivegnis;Jean-François Vanhumbeeck;Alexandre Felten

    (2020)
    32 Citations
  • Electronic structure and electrochemical properties of La-doped BiFeO3 nanoparticles

    Shalendra Kumar;Shalendra Kumar;Garima Srivastava;Ghazzai Almutairi;Faheem Ahmed

    (2021)
    26 Citations
  • Box plots: A simple graphical tool for visualizing overfitting in peak fitting as demonstrated with X-ray photoelectron spectroscopy data

    Behnam Moeini;Hyrum Haack;Neal Fairley;Vincent Fernandez

    (2021)
    23 Citations
  • Application of near-ambient pressure X-ray photoelectron spectroscopy (NAP-XPS) in an in-situ analysis of the stability of the surface-supported metal-organic framework HKUST-1 in water, methanol and pyridine atmospheres

    Marit Kjærvik;Paul M. Dietrich;Andreas Thissen;Jörg Radnik

    (2021)
    20 Citations
  • XPS photoelectron lines, satellite structures and Wagner plot of Cu(II) β-diketonato complexes explained in terms of its electronic environment

    (2022)
    17 Citations
  • HHG-laser-based time- and angle-resolved photoemission spectroscopy of quantum materials

    Takeshi Suzuki;Shik Shin;Kozo Okazaki

    (2021)
    16 Citations

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Best Scientists Contributing to This Journal

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