IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Top Research Topics at IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems?

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems is mainly concerned with subjects like Algorithm, Electronic engineering, Integrated circuit, Electronic circuit and Embedded system. Algorithm research presented in it encompasses a variety of subjects, including Mathematical optimization and Automatic test pattern generation. Automatic test pattern generation study tackled is connected to the field of Fault coverage.

Fault coverage and Stuck-at fault are closely related fields of research discussed in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. It connects the study in Electronic engineering with the closely related area of Transistor. Topics in Integrated circuit were tackled in line with various other fields like Computer Aided Design and Circuit design.

The Embedded system research presented places emphasis on topics like System on a chip and Field-programmable gate array. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems focuses on Very-large-scale integration as well as the interrelated topic of Integrated circuit layout. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems dives deep in exploring the relationship between the study of Sequential logic and Combinational logic.

• Algorithm (26.31%)
• Electronic engineering (25.43%)
• Integrated circuit (12.62%)

What are the most cited papers published in the journal?

• Asymptotic waveform evaluation for timing analysis (1654 citations)
• PRIMA: passive reduced-order interconnect macromodeling algorithm (1229 citations)
• Efficient linear circuit analysis by Pade approximation via the Lanczos process (1170 citations)

Research areas of the most cited articles at IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems:

The most cited articles generally zeroe in on subjects such as Algorithm, Electronic engineering, Very-large-scale integration, Integrated circuit and Electronic circuit. The published articles explore research in Automatic test pattern generation and overlapping concepts in Fault coverage to expand the discourse in Algorithm. The works on Electronic engineering tackled in the published papers bring together disciplines like Transistor, Integrated circuit layout and Electrical engineering.

What topics the last edition of the journal is best known for?

• Operating system
• Quantum mechanics
• Artificial intelligence

The previous edition focused in particular on these issues:

The scientific interests tackled in the journal are Embedded system, Algorithm, Artificial intelligence, Computer engineering and Artificial neural network. The study on Algorithm presented is investigated in conjunction with research in Electronic circuit. Artificial intelligence research discussed connects with the study of Machine learning.

The journal holds forums on Artificial neural network that merges themes from other disciplines such as Overhead (computing) and Resistive random-access memory. It features Overhead (computing) research that overlaps with concepts in Reliability (computer networking).

The most cited articles from the last journal are:

• RxNN: A Framework for Evaluating Deep Neural Networks on Resistive Crossbars (27 citations)
• A Cost-Effective TSV Repair Architecture for Clustered Faults in 3-D IC (18 citations)
• CKFO: Convolution Kernel First Operated Algorithm With Applications in Memristor-Based Convolutional Neural Network (18 citations)

Papers citation over time

A key indicator for each journal is its effectiveness in reaching other researchers with the papers published at that venue.

The chart below presents the interquartile range (first quartile 25%, median 50% and third quartile 75%) of the number of citations of articles over time.

Top authors and change over time

The top authors publishing in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (based on the number of publications) are:

• Krishnendu Chakrabarty (142 papers) published 19 papers at the last edition, 5 more than at the previous edition,
• Irith Pomeranz (114 papers) published 9 papers at the last edition the same number as at the previous edition,
• Yao-Wen Chang (73 papers) published 4 papers at the last edition,
• Sudhakar M. Reddy (72 papers) published 1 paper at the last edition, 1 less than at the previous edition,
• Alberto Sangiovanni-Vincentelli (69 papers) absent at the last edition.

The overall trend for top authors publishing in this journal is outlined below. The chart shows the number of publications at each edition of the journal for top authors.

Top affiliations and change over time

Only papers with recognized affiliations are considered

The top affiliations publishing in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (based on the number of publications) are:

• IBM (234 papers) published 4 papers at the last edition, 1 more than at the previous edition,
• University of Illinois at Urbana–Champaign (192 papers) published 3 papers at the last edition, 1 less than at the previous edition,
• Intel (177 papers) published 5 papers at the last edition, 2 less than at the previous edition,
• University of California, Berkeley (170 papers) published 1 paper at the last edition, 5 less than at the previous edition,
• Duke University (162 papers) published 20 papers at the last edition, 1 less than at the previous edition.

The overall trend for top affiliations publishing in this journal is outlined below. The chart shows the number of publications at each edition of the journal for top affiliations.

Publication chance based on affiliation

The publication chance index shows the ratio of articles published by the best research institutions in the journal edition to all articles published within that journal. The best research institutions were selected based on the largest number of articles published during all editions of the journal.

The chart below presents the percentage ratio of articles from top institutions (based on their ranking of total papers).Top affiliations were grouped by their rank into the following tiers: top 1-10, top 11-20, top 21-50, and top 51+. Only articles with a recognized affiliation are considered.

During the most recent 2021 edition, 28.20% of publications had an unrecognized affiliation. Out of the publications with recognized affiliations, 21.12% were posted by at least one author from the top 10 institutions publishing in the journal. Another 10.56% included authors affiliated with research institutions from the top 11-20 affiliations. Institutions from the 21-50 range included 21.45% of all publications and 46.86% were from other institutions.

Returning Authors Index

A very common phenomenon observed among researchers publishing scientific articles is the intentional selection of journals they have already attended in the past. In particular, it is worth analyzing the case when the authors participate in the same journal from year to year.

The Returning Authors Index presented below illustrates the ratio of authors who participated in both a given as well as the previous edition of the journal in relation to all participants in a given year.

Returning Institution Index

The graph below shows the Returning Institution Index, illustrating the ratio of institutions that participated in both a given and the previous edition of the conference in relation to all affiliations present in a given year.

The experience to innovation index

Our experience to innovation index was created to show a cross-section of the experience level of authors publishing in a journal. The index includes the authors publishing at the last edition of a journal, grouped by total number of publications throughout their academic career (P) and the total number of citations of these publications ever received (C).

The group intervals were selected empirically to best show the diversity of the authors' experiences, their labels were selected as a convenience, not as judgment. The authors were divided into the following groups:

• Novice - P < 5 or C < 25 (the number of publications less than 5 or the number of citations less than 25),
• Competent - P < 10 or C < 100 (the number of publications less than 10 or the number of citations less than 100),
• Experienced - P < 25 or C < 625 (the number of publications less than 25 or the number of citations less than 625),
• Master - P < 50 or C < 2500 (the number of publications less than 50 or the number of citations less than 2500),
• Star - P ≥ 50 and C ≥ 2500 (both the number of publications greater than 50 and the number of citations greater than 2500).

The chart below illustrates experience levels of first authors in cases of publications with multiple authors.