Integration, the VLSI Journal

Top Research Topics at Integration?

Integration focuses on Electronic engineering, Algorithm, CMOS, Integrated circuit and Very-large-scale integration. While it focused on Electronic engineering, it was also able to explore topics like Electronic circuit, Chip, Voltage, Transistor and Electrical engineering. Many of the studies tackled connect Algorithm with a similar field of study like Routing (electronic design automation).

Integration links adjacent topics like Integrated circuit with Circuit design.

• Electronic engineering (20.42%)
• Algorithm (13.81%)
• CMOS (10.35%)

What are the most cited papers published in the journal?

• Recent directions in netlist partitioning: a survey (583 citations)
• HERMES: an infrastructure for low area overhead packet-switching networks on chip (478 citations)
• Performance optimization of VLSI interconnect layout (296 citations)

Research areas of the most cited articles at Integration:

The published papers generally zeroe in on subjects such as Electronic engineering, Algorithm, Integrated circuit, Embedded system and Very-large-scale integration. The most cited articles with studies in Electronic engineering featured incorporate elements of Transistor, Adder and Electrical engineering. The most cited papers facilitate discussions on Algorithm that incorporate concepts from other fields like Field-programmable gate array and Theoretical computer science.

What topics the last edition of the journal is best known for?

• Law
• Operating system
• Artificial intelligence

The previous edition focused in particular on these issues:

The main points discussed in the journal deals with CMOS, Algorithm, Voltage, Node (circuits) and Very-large-scale integration. CMOS research presented falls under the umbrella topic of Electrical engineering. The studies on Algorithm discussed can also contribute to research in the domains of Hadamard transform, Reliability (computer networking), Integer (computer science) and Discrete cosine transform.

The close relationship between Energy consumption and Electronic engineering is one of the points of interest dissected in Node (circuits) research. Integration explores issues in Electronic engineering which can be linked to other research areas like RF front end, Inductor and Noise figure. The study of Very-large-scale integration encompasses disciplines such as Test set, as well as fields such as Overhead (computing), all of which overlap with one another.

The most cited articles from the last journal are:

• Efficient VLSI architecture of 3D discrete transformation (0 citations)
• Speeding-up neuromorphic computation for neural networks: Structure optimization approach (0 citations)
• New approach for digital calibration of pipelined analog to digital converters based on secant method (0 citations)

Papers citation over time

A key indicator for each journal is its effectiveness in reaching other researchers with the papers published at that venue.

The chart below presents the interquartile range (first quartile 25%, median 50% and third quartile 75%) of the number of citations of articles over time.

Top authors and change over time

The top authors publishing in Integration (based on the number of publications) are:

• Frédéric Krumbein (24 papers) absent at the last edition,
• Sheldon X.-D. Tan (21 papers) absent at the last edition,
• Gunhan Dundar (18 papers) absent at the last edition,
• Francisco V. Fernández (16 papers) absent at the last edition,
• Nuno Horta (15 papers) absent at the last edition.

The overall trend for top authors publishing in this journal is outlined below. The chart shows the number of publications at each edition of the journal for top authors.

Top affiliations and change over time

Only papers with recognized affiliations are considered

The top affiliations publishing in Integration (based on the number of publications) are:

• Indian Institute of Technology Kharagpur (34 papers) absent at the last edition,
• IBM (29 papers) absent at the last edition,
• Tsinghua University (29 papers) absent at the last edition,
• University of California, Riverside (23 papers) absent at the last edition,
• Intel (19 papers) absent at the last edition.

The overall trend for top affiliations publishing in this journal is outlined below. The chart shows the number of publications at each edition of the journal for top affiliations.

Publication chance based on affiliation

The publication chance index shows the ratio of articles published by the best research institutions in the journal edition to all articles published within that journal. The best research institutions were selected based on the largest number of articles published during all editions of the journal.

The chart below presents the percentage ratio of articles from top institutions (based on their ranking of total papers).Top affiliations were grouped by their rank into the following tiers: top 1-10, top 11-20, top 21-50, and top 51+. Only articles with a recognized affiliation are considered.

During the most recent 2022 edition, 21.43% of publications had an unrecognized affiliation. Out of the publications with recognized affiliations, 0.00% were posted by at least one author from the top 10 institutions publishing in the journal. Another 9.09% included authors affiliated with research institutions from the top 11-20 affiliations. Institutions from the 21-50 range included 9.09% of all publications and 81.82% were from other institutions.

Returning Authors Index

A very common phenomenon observed among researchers publishing scientific articles is the intentional selection of journals they have already attended in the past. In particular, it is worth analyzing the case when the authors participate in the same journal from year to year.

The Returning Authors Index presented below illustrates the ratio of authors who participated in both a given as well as the previous edition of the journal in relation to all participants in a given year.

Returning Institution Index

The graph below shows the Returning Institution Index, illustrating the ratio of institutions that participated in both a given and the previous edition of the conference in relation to all affiliations present in a given year.

The experience to innovation index

Our experience to innovation index was created to show a cross-section of the experience level of authors publishing in a journal. The index includes the authors publishing at the last edition of a journal, grouped by total number of publications throughout their academic career (P) and the total number of citations of these publications ever received (C).

The group intervals were selected empirically to best show the diversity of the authors' experiences, their labels were selected as a convenience, not as judgment. The authors were divided into the following groups:

• Novice - P < 5 or C < 25 (the number of publications less than 5 or the number of citations less than 25),
• Competent - P < 10 or C < 100 (the number of publications less than 10 or the number of citations less than 100),
• Experienced - P < 25 or C < 625 (the number of publications less than 25 or the number of citations less than 625),
• Master - P < 50 or C < 2500 (the number of publications less than 50 or the number of citations less than 2500),
• Star - P ≥ 50 and C ≥ 2500 (both the number of publications greater than 50 and the number of citations greater than 2500).

The chart below illustrates experience levels of first authors in cases of publications with multiple authors.