| Discipline name | Position | Best Scientists | Publications | D-Index |
|---|---|---|---|---|
| Materials Science | 447 | 64 | 90 | 14 |
Electronic Materials Letters focuses largely on the fields of Optoelectronics, Analytical chemistry, Composite material, Thin film and Nanotechnology. The research on Optoelectronics featured in the journal combines topics in other fields like Layer (electronics), Substrate (electronics) and Thin-film transistor. While Electronic Materials Letters focused on Analytical chemistry, it was also able to explore topics like Doping, Electrical resistivity and conductivity and Scanning electron microscope.
Electronic Materials Letters focuses on Electrical resistivity and conductivity but sometimes tackles the closely related topic of Thermoelectric effect which is concerned with Thermal conductivity. Electronic Materials Letters focuses on Scanning electron microscope research which is adjacent to topics in Transmission electron microscopy. The close relationship between Dielectric and Ceramic is one of the points of interest dissected in Composite material research.
The journal addresses concerns in Thin film which are intertwined with other disciplines, such as Annealing (metallurgy), Band gap and Crystallite. It emphasizes research on Nanotechnology, which includes concerns such as Nanoparticle. Research in Microstructure tackled falls within the umbrella of Metallurgy.
Analytical chemistry, Optoelectronics, Nanotechnology, Thin film and Composite material are the main subjects of interest in the journal articles. The journal papers facilitate discussions on Analytical chemistry that incorporate concepts from other fields like Electrical resistivity and conductivity, Doping and Band gap. The most cited articles address concerns in the field of Optoelectronics by exploring it in line with topics in Nanorod which intersect with Transmission electron microscopy subjects.
The journal primarily tackles Optoelectronics, Layer (electronics), Thin film, Analytical chemistry and Composite material. Topics in Optoelectronics explored in Electronic Materials Letters were investigated in conjunction with research in Transistor, Substrate (electronics), Laser and Thin-film transistor. The study of Secondary ion mass spectrometry and how it intertwines with concepts under Amorphous solid, Stress (mechanics), Hysteresis, Barrier layer and Capacitor were explored in the presented Layer (electronics) research.
While it focused on Thin film, it was also able to explore topics like Grain boundary, Crystallization, Chemical vapor deposition and Scanning electron microscope. Electronic Materials Letters focuses on Analytical chemistry but sometimes tackles the closely related disciplines such as
A key indicator for each journal is its effectiveness in reaching other researchers with the papers published at that venue.
The chart below presents the interquartile range (first quartile 25%, median 50% and third quartile 75%) of the number of citations of articles over time.
The top authors publishing in Electronic Materials Letters (based on the number of publications) are:
The overall trend for top authors publishing in this journal is outlined below. The chart shows the number of publications at each edition of the journal for top authors.
Only papers with recognized affiliations are considered
The top affiliations publishing in Electronic Materials Letters (based on the number of publications) are:
The overall trend for top affiliations publishing in this journal is outlined below. The chart shows the number of publications at each edition of the journal for top affiliations.
The publication chance index shows the ratio of articles published by the best research institutions in the journal edition to all articles published within that journal. The best research institutions were selected based on the largest number of articles published during all editions of the journal.
The chart below presents the percentage ratio of articles from top institutions (based on their ranking of total papers).Top affiliations were grouped by their rank into the following tiers: top 1-10, top 11-20, top 21-50, and top 51+. Only articles with a recognized affiliation are considered.
During the most recent 2021 edition, 7.46% of publications had an unrecognized affiliation. Out of the publications with recognized affiliations, 30.65% were posted by at least one author from the top 10 institutions publishing in the journal. Another 12.90% included authors affiliated with research institutions from the top 11-20 affiliations. Institutions from the 21-50 range included 22.58% of all publications and 33.87% were from other institutions.
A very common phenomenon observed among researchers publishing scientific articles is the intentional selection of journals they have already attended in the past. In particular, it is worth analyzing the case when the authors participate in the same journal from year to year.
The Returning Authors Index presented below illustrates the ratio of authors who participated in both a given as well as the previous edition of the journal in relation to all participants in a given year.
The graph below shows the Returning Institution Index, illustrating the ratio of institutions that participated in both a given and the previous edition of the conference in relation to all affiliations present in a given year.
Our experience to innovation index was created to show a cross-section of the experience level of authors publishing in a journal. The index includes the authors publishing at the last edition of a journal, grouped by total number of publications throughout their academic career (P) and the total number of citations of these publications ever received (C).
The group intervals were selected empirically to best show the diversity of the authors' experiences, their labels were selected as a convenience, not as judgment. The authors were divided into the following groups:
The chart below illustrates experience levels of first authors in cases of publications with multiple authors.
Sung Hwan Cho;Jun Min Suh;Tae Hoon Eom;Taehoon Kim
(2021)Unknown
(2022)Anand Sharma;Nitesh K. Chourasia;Vishwas Acharya;Nila Pal
(2020)Sung Hoon Park;Ajeet Kumar;J. Kaarthik;Venkateswarlu Annapureddy
(2020)Bo Reum Lee;Ho Won Jang
(2021)Yongqi Yin;Yongqi Yin;Sufang Fu;Sheng Zhou;Yuling Song
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