Ranking & Metrics Journal Information Aims & Scope of the Journal Special Issues
Journal of Electronic Imaging

Journal of Electronic Imaging

Impact Score 3.3


Ranking & Metrics Impact Score is a novel metric devised to rank conferences based on the number of contributing top scientists in addition to the h-index estimated from the scientific papers published by top scientists. See more details on our methodology page.

Research Impact Score: 3.3
JCR Impact Factor: 0.884
Scopus Citescore: 2
SCIMAGO H-index: 63
Research Ranking (Computer Science) 304
Number of Top scientists: 81
Documents by top scientists: 163

Journal Information

ISSN: 1017-9909
Publisher: Journal of Electronic Imaging
Periodicity: Quarterly
Journal & Submission Website: http://spie.org/x868.xml

Aims & Scope of the Journal

Journal of Electronic Imaging publishes scientific papers studying recent fundamental contributions in the areas of Hardware, Robotics & Electronics, Image Processing & Computer Vision, Machine Learning & Artificial intelligence and Signal Processing. The publication protocol for Journal of Electronic Imaging is to publish new original documents that have been extensively reviewed by skilled academic peers. The journal welcomes submissions from the research community where emphasis will be placed on the originality and the practical significance of the published work.

Journal of Electronic Imaging is listed in a wide scope of abstracting and indexing databases like Scopus, Web of Science and Guide2Research. A number of leading scientists have published their research contributions at this Journal among them Sos Agaian, Edward Delp, Karen Egiazarian and Charles A Bouman.

For more information on the rules and submission provisions for authors, you are advised to see the official website for the journal for Journal of Electronic Imaging at http://spie.org/x868.xml .

Special Issues

Publisher Journal Details Closing date G2R Score
Perceptually Driven Visual Information Analysis

Perceptually Driven Visual Information Analysis

Journal of Electronic Imaging