| Discipline name | Position | Best Scientists | Publications | D-Index |
|---|---|---|---|---|
| Electronics and Electrical Engineering | 284 | 42 | 80 | 13 |
| Engineering and Technology | 953 | 16 | 42 | 8 |
International Journal of Numerical Modelling-electronic Networks Devices and Fields covers a variety of subjects, including Electronic engineering, Mathematical analysis, Algorithm, Optoelectronics and Finite element method. The studies in Electronic engineering featured incorporate elements of Time domain, Equivalent circuit, Transmission line, Electrical engineering and Transistor. The work on Mathematical analysis tackled in it brings together disciplines like Geometry and Finite-difference time-domain method, Optics.
Mixed finite element method is a focus of the presented Finite element method works and it dives deep in Mixed finite element method.
The journal publications are organized to reinforce research efforts on Electronic engineering, Mathematical analysis, Algorithm, Finite-difference time-domain method and Applied mathematics. The published papers address concerns in the field of Electronic engineering by exploring it in line with topics in Field (physics) which intersect with Electromagnetic field and Computational physics subjects. The most cited articles address concerns in Mathematical analysis which are intertwined with other disciplines, such as Time domain and Finite element method.
The discussions in the journal mainly cover the fields of Optoelectronics, Electronic engineering, Control theory, Algorithm and Electrical engineering. The studies in Terahertz radiation under the umbrella field of Optoelectronics overlap with concepts in Scalability. Some problems in Control theory that were presented in it overlapped with concepts under Microgrid and Doubly fed electric machine.
International Journal of Numerical Modelling-electronic Networks Devices and Fields centers on topics in High-electron-mobility transistor, with a focus on Algan gan.
A key indicator for each journal is its effectiveness in reaching other researchers with the papers published at that venue.
The chart below presents the interquartile range (first quartile 25%, median 50% and third quartile 75%) of the number of citations of articles over time.
The top authors publishing in International Journal of Numerical Modelling-electronic Networks Devices and Fields (based on the number of publications) are:
The overall trend for top authors publishing in this journal is outlined below. The chart shows the number of publications at each edition of the journal for top authors.
Only papers with recognized affiliations are considered
The top affiliations publishing in International Journal of Numerical Modelling-electronic Networks Devices and Fields (based on the number of publications) are:
The overall trend for top affiliations publishing in this journal is outlined below. The chart shows the number of publications at each edition of the journal for top affiliations.
The publication chance index shows the ratio of articles published by the best research institutions in the journal edition to all articles published within that journal. The best research institutions were selected based on the largest number of articles published during all editions of the journal.
The chart below presents the percentage ratio of articles from top institutions (based on their ranking of total papers).Top affiliations were grouped by their rank into the following tiers: top 1-10, top 11-20, top 21-50, and top 51+. Only articles with a recognized affiliation are considered.
During the most recent 2021 edition, 6.41% of publications had an unrecognized affiliation. Out of the publications with recognized affiliations, 15.07% were posted by at least one author from the top 10 institutions publishing in the journal. Another 4.11% included authors affiliated with research institutions from the top 11-20 affiliations. Institutions from the 21-50 range included 10.96% of all publications and 69.86% were from other institutions.
A very common phenomenon observed among researchers publishing scientific articles is the intentional selection of journals they have already attended in the past. In particular, it is worth analyzing the case when the authors participate in the same journal from year to year.
The Returning Authors Index presented below illustrates the ratio of authors who participated in both a given as well as the previous edition of the journal in relation to all participants in a given year.
The graph below shows the Returning Institution Index, illustrating the ratio of institutions that participated in both a given and the previous edition of the conference in relation to all affiliations present in a given year.
Our experience to innovation index was created to show a cross-section of the experience level of authors publishing in a journal. The index includes the authors publishing at the last edition of a journal, grouped by total number of publications throughout their academic career (P) and the total number of citations of these publications ever received (C).
The group intervals were selected empirically to best show the diversity of the authors' experiences, their labels were selected as a convenience, not as judgment. The authors were divided into the following groups:
The chart below illustrates experience levels of first authors in cases of publications with multiple authors.
Zlatica Marinković;Giovanni Crupi;Alina Caddemi;Vera Marković
(2020)Anwar Jarndal;Ahmed Hussein;Giovanni Crupi;Alina Caddemi
(2020)Toktam Aghaee;Ali A. Orouji
(2020)Leifur Leifsson;Xiaosong Du;Slawomir Koziel
(2020)Jing Jin;Jing Jin;Feng Feng;Weicong Na;Shuxia Yan
(2020)Toktam Aghaee;Ali A. Orouji
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