0018-9200
Published by: IEEE
http://sscs.ieee.org/publications/ieee-journal-of-solid-state-circuits-jssc
| Discipline name | Position | Best Scientists | Publications | D-Index |
|---|---|---|---|---|
| Electronics and Electrical Engineering | 48 | 301 | 953 | 49 |
| Engineering and Technology | 625 | 20 | 31 | 14 |
The objective of IEEE Journal of Solid-state Circuits is to combine knowledge in the areas of Electronic engineering, Electrical engineering, CMOS, Amplifier and Integrated circuit. The research on Electronic engineering featured in IEEE Journal of Solid-state Circuits combines topics in other fields like Electronic circuit, Chip and Low-power electronics. The Electrical engineering study featured in the journal draws parallels with the field of Optoelectronics.
CMOS research presented in the journal encompasses a variety of subjects, including Computer hardware, Jitter, Phase-locked loop, Very-large-scale integration and Circuit design. The study of Phase-locked loop encompasses disciplines such as Phase noise, as well as fields such as Voltage-controlled oscillator, all of which overlap with one another. Amplifier, which encompasses Direct-coupled amplifier and Noise figure, is the main subject of it.
Some problems in Logic gate that were presented in it overlapped with concepts under Pass transistor logic and Integrated injection logic. The in-depth study on Voltage also explores topics in the intersecting field of Power (physics). In particular, the Logic family works presented emphasize discussions on Resistor–transistor logic.
The journal publications are mainly concerned with subjects like Electronic engineering, Electrical engineering, CMOS, Amplifier and Low-power electronics. The most cited articles address concerns in the field of Electronic engineering by exploring it in line with topics in Phase-locked loop which intersect with Jitter subjects. The most cited publications explore research in CMOS alongside concepts in Logic gate and other areas of study in Pass transistor logic and Digital electronics.
The journal is mainly concerned with subjects like CMOS, Electrical engineering, Electronic engineering, Amplifier and Chip. The journal explores studies in CMOS as part of the wider topic of Optoelectronics. It facilitates discussions on Electronic engineering that incorporate concepts from other fields like Noise (electronics), Sampling (signal processing) and Figure of merit.
While the journal focused on Amplifier, it was also able to explore topics like Electrical impedance, Modulation and Wideband. Concepts in Computer hardware, as well as related topics in Throughput (business) and Efficient energy use, are covered in the Chip research presented in the journal. The study of Phase-locked loop and how it intertwines with concepts under Phase noise were explored in the presented Jitter research.
A key indicator for each journal is its effectiveness in reaching other researchers with the papers published at that venue.
The chart below presents the interquartile range (first quartile 25%, median 50% and third quartile 75%) of the number of citations of articles over time.
The top authors publishing in IEEE Journal of Solid-state Circuits (based on the number of publications) are:
The overall trend for top authors publishing in this journal is outlined below. The chart shows the number of publications at each edition of the journal for top authors.
Only papers with recognized affiliations are considered
The top affiliations publishing in IEEE Journal of Solid-state Circuits (based on the number of publications) are:
The overall trend for top affiliations publishing in this journal is outlined below. The chart shows the number of publications at each edition of the journal for top affiliations.
The publication chance index shows the ratio of articles published by the best research institutions in the journal edition to all articles published within that journal. The best research institutions were selected based on the largest number of articles published during all editions of the journal.
The chart below presents the percentage ratio of articles from top institutions (based on their ranking of total papers).Top affiliations were grouped by their rank into the following tiers: top 1-10, top 11-20, top 21-50, and top 51+. Only articles with a recognized affiliation are considered.
During the most recent 2021 edition, 12.65% of publications had an unrecognized affiliation. Out of the publications with recognized affiliations, 21.45% were posted by at least one author from the top 10 institutions publishing in the journal. Another 16.43% included authors affiliated with research institutions from the top 11-20 affiliations. Institutions from the 21-50 range included 24.51% of all publications and 37.60% were from other institutions.
A very common phenomenon observed among researchers publishing scientific articles is the intentional selection of journals they have already attended in the past. In particular, it is worth analyzing the case when the authors participate in the same journal from year to year.
The Returning Authors Index presented below illustrates the ratio of authors who participated in both a given as well as the previous edition of the journal in relation to all participants in a given year.
The graph below shows the Returning Institution Index, illustrating the ratio of institutions that participated in both a given and the previous edition of the conference in relation to all affiliations present in a given year.
Our experience to innovation index was created to show a cross-section of the experience level of authors publishing in a journal. The index includes the authors publishing at the last edition of a journal, grouped by total number of publications throughout their academic career (P) and the total number of citations of these publications ever received (C).
The group intervals were selected empirically to best show the diversity of the authors' experiences, their labels were selected as a convenience, not as judgment. The authors were divided into the following groups:
The chart below illustrates experience levels of first authors in cases of publications with multiple authors.
Shihui Yin;Zhewei Jiang;Jae-Sun Seo;Mingoo Seok
(2020)Zhewei Jiang;Shihui Yin;Jae-Sun Seo;Mingoo Seok
(2020)Xiyuan Tang;Linxiao Shen;Begum Kasap;Xiangxing Yang
(2020)Jingcheng Wang;Xiaowei Wang;Charles Eckert;Arun Subramaniyan
(2020)Hongyang Jia;Hossein Valavi;Yinqi Tang;Jintao Zhang
(2020)Xin Si;Rui Liu;Shimeng Yu;Ren-Shuo Liu
(2020)Yun Wang;Rui Wu;Jian Pang;Dongwon You
(2020)Lei Deng;Guanrui Wang;Guoqi Li;Shuangchen Li
(2020)Jian Pang;Zheng Li;Ryo Kubozoe;Xueting Luo
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