| Discipline name | Position | Best Scientists | Publications | D-Index |
|---|---|---|---|---|
| Electronics and Electrical Engineering | 226 | 97 | 164 | 16 |
| Computer Science | 299 | 138 | 206 | 19 |
The journal focuses largely on the fields of Embedded system, Electronic engineering, Test (assessment), Computer architecture and Electronic design automation. While it focused on Embedded system, it was also able to explore topics like Software, Debugging and Computer hardware. Electronic engineering research featured in it incorporates concerns from various other topics such as Power (physics) and Electronic circuit, Electrical engineering.
IEEE Design & Test of Computers links adjacent topics like Test (assessment) with Reliability engineering. The concepts on Reliability engineering presented in IEEE Design & Test of Computers can also apply to other research fields, including Design for testing and Automatic test pattern generation. Most of the works presented in the journal deals with Electronic design automation but it intersects with the subject of Software engineering.
The most cited publications mainly deal with areas of study such as Embedded system, Electronic engineering, Computer architecture, Logic synthesis and Automatic test pattern generation. The Embedded system study tackled in the published articles is a key component of adjacent topics in the area of Software. The studies on Electronic engineering discussed at the most cited publications can also contribute to research in the domains of Power (physics) and Electronic circuit, Electrical engineering.
The journal investigates areas of study like Artificial intelligence, Test (assessment), Computer security, Computer hardware and Electronic circuit. Test (assessment) research in it involves the investigation of Electronic design automation studies, all of which are linked to disciplines such as Computer architecture and IBM. It explores issues in Computer security which can be linked to other research areas like Competition (economics), System on a chip, Resource management and Software bug.
The study of Software engineering and how it intertwines with concepts under Open source were explored in the presented System on a chip research. IEEE Design & Test of Computers explores research in Software and overlapping concepts in Embedded system to expand the discourse in Resource management. Topics in Electronic circuit explored in it were investigated in conjunction with research in Logic synthesis, Electronic engineering, Logic gate and Topology (electrical circuits).
A key indicator for each journal is its effectiveness in reaching other researchers with the papers published at that venue.
The chart below presents the interquartile range (first quartile 25%, median 50% and third quartile 75%) of the number of citations of articles over time.
The top authors publishing in IEEE Design & Test of Computers (based on the number of publications) are:
The overall trend for top authors publishing in this journal is outlined below. The chart shows the number of publications at each edition of the journal for top authors.
Only papers with recognized affiliations are considered
The top affiliations publishing in IEEE Design & Test of Computers (based on the number of publications) are:
The overall trend for top affiliations publishing in this journal is outlined below. The chart shows the number of publications at each edition of the journal for top affiliations.
The publication chance index shows the ratio of articles published by the best research institutions in the journal edition to all articles published within that journal. The best research institutions were selected based on the largest number of articles published during all editions of the journal.
The chart below presents the percentage ratio of articles from top institutions (based on their ranking of total papers).Top affiliations were grouped by their rank into the following tiers: top 1-10, top 11-20, top 21-50, and top 51+. Only articles with a recognized affiliation are considered.
During the most recent 2021 edition, 25.23% of publications had an unrecognized affiliation. Out of the publications with recognized affiliations, 18.07% were posted by at least one author from the top 10 institutions publishing in the journal. Another 4.82% included authors affiliated with research institutions from the top 11-20 affiliations. Institutions from the 21-50 range included 13.25% of all publications and 63.86% were from other institutions.
A very common phenomenon observed among researchers publishing scientific articles is the intentional selection of journals they have already attended in the past. In particular, it is worth analyzing the case when the authors participate in the same journal from year to year.
The Returning Authors Index presented below illustrates the ratio of authors who participated in both a given as well as the previous edition of the journal in relation to all participants in a given year.
The graph below shows the Returning Institution Index, illustrating the ratio of institutions that participated in both a given and the previous edition of the conference in relation to all affiliations present in a given year.
Our experience to innovation index was created to show a cross-section of the experience level of authors publishing in a journal. The index includes the authors publishing at the last edition of a journal, grouped by total number of publications throughout their academic career (P) and the total number of citations of these publications ever received (C).
The group intervals were selected empirically to best show the diversity of the authors' experiences, their labels were selected as a convenience, not as judgment. The authors were divided into the following groups:
The chart below illustrates experience levels of first authors in cases of publications with multiple authors.
Falk Schellenberg;Dennis R. E. Gnad;Amir Moradi;Mehdi B. Tahoori
(2021)Muhammad Shafique;Mahum Naseer;Theocharis Theocharides;Christos Kyrkou
(2020)Sanjit A. Seshia;Somesh Jha;Tommaso Dreossi
(2020)Siqi Wang;Anuj Pathania;Tulika Mitra
(2020)Sudeep Pasricha;Raid Ayoub;Michael Kishinevsky;Sumit K. Mandal
(2020)Felix Staudigl;Farhad Merchant;Rainer Leupers
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