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IEEE

5th International Conference on Control and Fault-Tolerant Systems (SysTol)

Location: Saint-Raphaël , France

Submission deadline: 7/30/2021

Conference dates: 9/29/2021 - 9/30/2021

Research H-index
5

Ranking & Metrics

Discipline name Position Best Scientists Publications D-Index
Electronics and Electrical Engineering 435 10 23 5

Call for Papers

Research areas:
Fault detection and isolation
Fault tolerant control / fault recovery
Networked control system
Health monitoring
Quality monitoring
Decision making
Discrete event and hybrid systems
Supervisory control
Fault-forecasting methods
Design for reliability and safety
Model-based methods
Data driven methods
Maintenance policies
Risk analysis

Industrial applications – Case studies:
Cybersecurity
Transportation systems
Automobile
Autonomous vehicles
Power plants / energy transport
Chemical processes
Aeronautics / aerospace
Civil engineering
Building supervision
Mining and mineral and metal processing
Water treatment
Communication networks
Mechatronic and robotic
Medical device

Overview

This comprehensive ranking highlights the leading scientific conferences in the field of Electronics and Electrical Engineering. The list has been meticulously compiled by Research.com, a prominent source of scientific research information and trusted data across all major disciplines including Electronics and Electrical Engineering, having supported the research community since 2014.

Conference positions are determined based on Research.com’s unique bibliometric score, an advanced metric developed to ensure accuracy and relevance. This score is calculated by taking into account both the estimated h-index and the number of leading scientists who have presented at each conference over the preceding three years. To ensure the highest standards and credibility, the Impact Score values included in this ranking are based on data collected as of 2024-11-27.

The development of this ranking entailed a rigorous analysis of more than 2,204 conferences. This selection followed a thorough review and critical examination of over 95,378 scientific documents published in the past three years by a cohort of 6,160 highly respected scientists specializing in Electronics and Electrical Engineering. This careful approach underscores the depth and complexity of expertise employed in producing a reliable and authoritative resource for the academic and professional community.

For a detailed explanation of the methodology and the comprehensive process used to compute these ranking scores, please consult our Methodology Page.

Papers citation over time

A key indicator for each conference is its effectiveness in reaching other researchers with the papers published at that venue.

The chart below presents the interquartile range (first quartile 25%, median 50% and third quartile 75%) of the number of citations of articles over time.

The top authors publishing at Conference on Control and Fault-Tolerant Systems (based on the number of publications) are:

  • Vicenç Puig (40 papers) absent at the last edition,
  • Didier Theilliol (16 papers) absent at the last edition,
  • Youmin Zhang (15 papers) absent at the last edition,
  • Dominique Sauter (11 papers) absent at the last edition,
  • Jan Lunze (10 papers) absent at the last edition.

The overall trend for top authors publishing at this conference is outlined below. The chart shows the number of publications at each edition of the conference for top authors.

Only papers with recognized affiliations are considered

The top affiliations publishing at Conference on Control and Fault-Tolerant Systems (based on the number of publications) are:

  • Polytechnic University of Catalonia (33 papers) absent at the last edition,
  • University of Lorraine (25 papers) absent at the last edition,
  • Spanish National Research Council (17 papers) absent at the last edition,
  • Centre national de la recherche scientifique (15 papers) absent at the last edition,
  • University of Zielona Góra (14 papers) absent at the last edition.

The overall trend for top affiliations publishing at this conference is outlined below. The chart shows the number of publications at each edition of the conference for top affiliations.

Publication chance based on affiliation

The publication chance index shows the ratio of articles published by the best research institutions at the conference edition to all articles published within that conference. The best research institutions were selected based on the largest number of articles published during all editions of the conference.

The chart below presents the percentage ratio of articles from top institutions (based on their ranking of total papers).Top affiliations were grouped by their rank into the following tiers: top 1-10, top 11-20, top 21-50, and top 51+. Only articles with a recognized affiliation are considered.

During the most recent 2021 edition, 66.67% of publications had an unrecognized affiliation. Out of the publications with recognized affiliations, 0.00% were posted by at least one author from the top 10 institutions publishing at the conference. Another 0.00% included authors affiliated with research institutions from the top 11-20 affiliations. Institutions from the 21-50 range included 100.00% of all publications and 0.00% were from other institutions.

Returning Authors Index

A very common phenomenon observed among researchers publishing scientific articles is the intentional selection of conferences they have already attended in the past. In particular, it is worth analyzing the case when the authors participate in the same conference from year to year.

The Returning Authors Index presented below illustrates the ratio of authors who participated in both a given as well as the previous edition of the conference in relation to all participants in a given year.

Returning Institution Index

The graph below shows the Returning Institution Index, illustrating the ratio of institutions that participated in both a given and the previous edition of the conference in relation to all affiliations present in a given year.

The experience to innovation index

Our experience to innovation index was created to show a cross-section of the experience level of authors publishing at a conference. The index includes the authors publishing at the last edition of a conference, grouped by total number of publications throughout their academic career (P) and the total number of citations of these publications ever received (C).

The group intervals were selected empirically to best show the diversity of the authors' experiences, their labels were selected as a convenience, not as judgment. The authors were divided into the following groups:

  • Novice - P < 5 or C < 25 (the number of publications less than 5 or the number of citations less than 25),
  • Competent - P < 10 or C < 100 (the number of publications less than 10 or the number of citations less than 100),
  • Experienced - P < 25 or C < 625 (the number of publications less than 25 or the number of citations less than 625),
  • Master - P < 50 or C < 2500 (the number of publications less than 50 or the number of citations less than 2500),
  • Star - P ≥ 50 and C ≥ 2500 (both the number of publications greater than 50 and the number of citations greater than 2500).

The chart below illustrates experience levels of first authors in cases of publications with multiple authors.

Related Online Degrees & Career Pathways

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