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IEEE

IEEE Conference on Antenna Measurements & Applications (CAMA)

Location: Guangzhou , China

Conference dates: 11/14/2022 - 11/17/2022

Research H-index
4

Ranking & Metrics

Discipline name Position Best Scientists Publications D-Index
Electronics and Electrical Engineering 454 85 121 4
Engineering and Technology 496 24 35 1

Call for Papers

The scope of 2022 IEEE CAMA includes but is not limited to
Abstract (1 page) Submission Deadline: 30 June 2022
Notification of Acceptance: 15 July 2022
Final Paper (2-6 pages) Submission Deadline: 15 September 2022
• Antenna Measurements in Controlled and Non-Controlled Environments
• Electromagnetic Measurement Methods and Techniques
• Scattering and Diffraction Measurements
• Near-field, Far-field, Compact and RCS Measurement and Calibration Techniques
• MIMO and OTA Testing
• Microwave, Millimeter-Wave, and THz Antennas and Systems
• Modeling, simulations, and predictions of Measurements in Realistic Environments
• Inverse & Imaging Methods and Techniques
• Applications: Electromagnetic Metrology and Compatibility, Radar, Radio Astronomy, Terrestrial and Spaced- Based
Communications including Wireless Communications, Sensing, Electronic Warfare, Aircraft (incl. UAV, UAS, RPAS) and
Automotive, Industry, Medicine, and E-Health, etc.

Overview

The scientific conference ranking provided on this page offers a comprehensive assessment of conferences within the field of Engineering and Technology. This authoritative ranking has been meticulously prepared by Research.com, a recognized leader in science research analytics since 2014, known for delivering reliable and trusted data on scientific contributions across all major disciplines, including Engineering and Technology.

The position of each conference in this ranking is determined using a unique bibliometric score developed by Research.com. This score is calculated based on an estimated h-index, as well as the number of leading scientists who have presented at the conference during the preceding three years. All Impact Score values featured in this ranking were collected as of 2024-11-27, ensuring that the assessment reflects the most current and relevant data available.

The ranking process involved a rigorous and comprehensive evaluation, beginning with a detailed inspection and review of over 2,262 conferences. This selection was grounded in the thorough examination of more than 26,934 scientific documents published over the last three years, contributed by 9,385 highly regarded and influential scientists within the Engineering and Technology community. This depth of analysis underscores the robustness and credibility of the ranking, as it draws upon both quantitative bibliometric measures and the expert presence within these prestigious conferences.

For readers interested in learning more about the methodology and the criteria used to calculate these ranking scores, detailed information is available on our Methodology Page.

Papers citation over time

A key indicator for each conference is its effectiveness in reaching other researchers with the papers published at that venue.

The chart below presents the interquartile range (first quartile 25%, median 50% and third quartile 75%) of the number of citations of articles over time.

The top authors publishing at IEEE Conference on Antenna Measurements & Applications (based on the number of publications) are:

  • Naruto Yonemoto (14 papers) absent at the last edition,
  • Andrea Massa (13 papers) absent at the last edition,
  • Tapan K. Sarkar (12 papers) absent at the last edition,
  • Satoru Kurokawa (12 papers) absent at the last edition,
  • Robin Augustine (11 papers) absent at the last edition.

The overall trend for top authors publishing at this conference is outlined below. The chart shows the number of publications at each edition of the conference for top authors.

Only papers with recognized affiliations are considered

The top affiliations publishing at IEEE Conference on Antenna Measurements & Applications (based on the number of publications) are:

  • Centre national de la recherche scientifique (40 papers) absent at the last edition,
  • King Mongkut's University of Technology North Bangkok (23 papers) absent at the last edition,
  • University of Trento (17 papers) absent at the last edition,
  • King Mongkut's Institute of Technology Ladkrabang (17 papers) absent at the last edition,
  • Syracuse University (16 papers) absent at the last edition.

The overall trend for top affiliations publishing at this conference is outlined below. The chart shows the number of publications at each edition of the conference for top affiliations.

Publication chance based on affiliation

The publication chance index shows the ratio of articles published by the best research institutions at the conference edition to all articles published within that conference. The best research institutions were selected based on the largest number of articles published during all editions of the conference.

The chart below presents the percentage ratio of articles from top institutions (based on their ranking of total papers).Top affiliations were grouped by their rank into the following tiers: top 1-10, top 11-20, top 21-50, and top 51+. Only articles with a recognized affiliation are considered.

During the most recent 2021 edition, 0.00% of publications had an unrecognized affiliation. Out of the publications with recognized affiliations, 0.00% were posted by at least one author from the top 10 institutions publishing at the conference. Another 0.00% included authors affiliated with research institutions from the top 11-20 affiliations. Institutions from the 21-50 range included 0.00% of all publications and 100.00% were from other institutions.

Returning Authors Index

A very common phenomenon observed among researchers publishing scientific articles is the intentional selection of conferences they have already attended in the past. In particular, it is worth analyzing the case when the authors participate in the same conference from year to year.

The Returning Authors Index presented below illustrates the ratio of authors who participated in both a given as well as the previous edition of the conference in relation to all participants in a given year.

Returning Institution Index

The graph below shows the Returning Institution Index, illustrating the ratio of institutions that participated in both a given and the previous edition of the conference in relation to all affiliations present in a given year.

The experience to innovation index

Our experience to innovation index was created to show a cross-section of the experience level of authors publishing at a conference. The index includes the authors publishing at the last edition of a conference, grouped by total number of publications throughout their academic career (P) and the total number of citations of these publications ever received (C).

The group intervals were selected empirically to best show the diversity of the authors' experiences, their labels were selected as a convenience, not as judgment. The authors were divided into the following groups:

  • Novice - P < 5 or C < 25 (the number of publications less than 5 or the number of citations less than 25),
  • Competent - P < 10 or C < 100 (the number of publications less than 10 or the number of citations less than 100),
  • Experienced - P < 25 or C < 625 (the number of publications less than 25 or the number of citations less than 625),
  • Master - P < 50 or C < 2500 (the number of publications less than 50 or the number of citations less than 2500),
  • Star - P ≥ 50 and C ≥ 2500 (both the number of publications greater than 50 and the number of citations greater than 2500).

The chart below illustrates experience levels of first authors in cases of publications with multiple authors.

Related Online Degrees & Career Pathways

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Overall, online learning options provide accessible and cost-effective pathways, allowing students and professionals to tailor their education to fit both career goals and lifestyle demands in the dynamic field of Electronics and Electrical Engineering.

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