| Discipline name | Position | Best Scientists | Publications | D-Index |
|---|---|---|---|---|
| Materials Science | 282 | 424 | 568 | 26 |
The journal investigates areas of study like Analytical chemistry, Solid-state physics, Optoelectronics, Thin film and Composite material. Topics in Analytical chemistry explored in the journal were investigated in conjunction with research in Annealing (metallurgy), Doping, Electrical resistivity and conductivity and Epitaxy. The overlapping concepts between Thermoelectric effect and Spark plasma sintering are the key highlights of Electrical resistivity and conductivity study.
Journal of Electronic Materials explores the study of Solid-state physics to improve our understanding of the broader topic of Condensed matter physics. The journal addresses concerns in Optoelectronics which are intertwined with other disciplines, such as Molecular beam epitaxy and Optics. Thin film research featured in it incorporates concerns from various other topics such as Chemical engineering, Substrate (electronics), Mineralogy and Chemical vapor deposition.
The concepts on Composite material presented in Journal of Electronic Materials can also apply to other research fields, including Metallurgy and Dielectric. The Metallurgy study tackled is a key component of adjacent topics in the area of Layer (electronics). The journal connects research in Microstructure with the related topic of Intermetallic.
The published articles primarily focus on research topics in Metallurgy, Analytical chemistry, Solid-state physics, Soldering and Optoelectronics. While the most cited publications focused on Analytical chemistry, they were also able to explore topics like Doping, Epitaxy, Thin film, Annealing (metallurgy) and Mineralogy. While the primary focus in the most cited articles is Solid-state physics, they also dissect topics surrounding Electrical resistivity and conductivity and Thermal conductivity as a whole.
The primary areas of discussion in the journal are Optoelectronics, Solid-state physics, Chemical engineering, Analytical chemistry and Composite material. It explores topics in Optoelectronics which can be helpful for research in disciplines like Layer (electronics) and Threshold voltage, Transistor. The study of Condensed matter physics serves as the foundation of the Solid-state physics research discussed in the journal.
The research on Analytical chemistry tackled can also make contributions to studies in the areas of Doping, Thin film, Scanning electron microscope, Dielectric and Band gap. Soldering, Microstructure and Composite number are some of the facets of Composite material tackled in it. Soldering research presented in the journal encompasses a variety of subjects, including Joint (geology) and Intermetallic.
A key indicator for each journal is its effectiveness in reaching other researchers with the papers published at that venue.
The chart below presents the interquartile range (first quartile 25%, median 50% and third quartile 75%) of the number of citations of articles over time.
The top authors publishing in Journal of Electronic Materials (based on the number of publications) are:
The overall trend for top authors publishing in this journal is outlined below. The chart shows the number of publications at each edition of the journal for top authors.
Only papers with recognized affiliations are considered
The top affiliations publishing in Journal of Electronic Materials (based on the number of publications) are:
The overall trend for top affiliations publishing in this journal is outlined below. The chart shows the number of publications at each edition of the journal for top affiliations.
The publication chance index shows the ratio of articles published by the best research institutions in the journal edition to all articles published within that journal. The best research institutions were selected based on the largest number of articles published during all editions of the journal.
The chart below presents the percentage ratio of articles from top institutions (based on their ranking of total papers).Top affiliations were grouped by their rank into the following tiers: top 1-10, top 11-20, top 21-50, and top 51+. Only articles with a recognized affiliation are considered.
During the most recent 2021 edition, 13.28% of publications had an unrecognized affiliation. Out of the publications with recognized affiliations, 3.98% were posted by at least one author from the top 10 institutions publishing in the journal. Another 3.37% included authors affiliated with research institutions from the top 11-20 affiliations. Institutions from the 21-50 range included 8.27% of all publications and 84.38% were from other institutions.
A very common phenomenon observed among researchers publishing scientific articles is the intentional selection of journals they have already attended in the past. In particular, it is worth analyzing the case when the authors participate in the same journal from year to year.
The Returning Authors Index presented below illustrates the ratio of authors who participated in both a given as well as the previous edition of the journal in relation to all participants in a given year.
The graph below shows the Returning Institution Index, illustrating the ratio of institutions that participated in both a given and the previous edition of the conference in relation to all affiliations present in a given year.
Our experience to innovation index was created to show a cross-section of the experience level of authors publishing in a journal. The index includes the authors publishing at the last edition of a journal, grouped by total number of publications throughout their academic career (P) and the total number of citations of these publications ever received (C).
The group intervals were selected empirically to best show the diversity of the authors' experiences, their labels were selected as a convenience, not as judgment. The authors were divided into the following groups:
The chart below illustrates experience levels of first authors in cases of publications with multiple authors.
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(2022)Huajing Gao;Xinxin Zhao;Haimin Zhang;Jiafu Chen
(2020)Shuang Chen;Yong Pan;Dajun Wang;Hong Deng
(2020)A. A. Menazea;A. M. Abdelghany;N. A. Hakeem;W. H. Osman
(2020)Subhransu S. Pradhan;Lakshmi Unnikrishnan;Smita Mohanty;Sanjay K. Nayak
(2020)Harish Kumar Choudhary;Rajeev Kumar;Shital Patangrao Pawar;Shital Patangrao Pawar;Suryasarathi Bose
(2020)Zhibo Cui;Chunlei Gao;Zhimin Fan;Jingfeng Wang
(2021)Sachin S. Pujari;Sujit A. Kadam;Yuan-Ron Ma;Pranav K. Katkar
(2020)M. J. Tommalieh;A. M. Ismail;Nasser S. Awwad;Hala A. Ibrahium
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