| Discipline name | Position | Best Scientists | Publications | D-Index |
|---|---|---|---|---|
| Computer Science | 184 | 130 | 168 | 28 |
| Engineering and Technology | 484 | 36 | 67 | 17 |
IEEE Transactions on Reliability is organized to address concerns in the fields of Reliability engineering, Reliability theory, Reliability (statistics), Statistics and Algorithm. It focuses on Reliability engineering research which is adjacent to topics in Component (UML). The journal holds forums on Reliability theory that merges themes from other disciplines such as Random variable, Reliability (computer networking), Stochastic process, Mathematical optimization and Applied mathematics.
Weibull distribution, Probability distribution, Estimator, Exponential distribution and Estimation theory are all topics related to Statistics research discussed.
The main points discussed in the most cited papers deal with Reliability engineering, Reliability theory, Reliability (statistics), Mathematical optimization and Algorithm. In addition to Reliability engineering research, the most cited publications aim to explore topics under Software quality and Software reliability testing. The published papers tackle topics on Reliability theory, which can potentially contribute to the wider field of Statistics.
The journal covers a variety of subjects, including Tourism, Context (language use), Reliability (statistics), Marketing and Reliability engineering. In IEEE Transactions on Reliability, Qualitative research, Order (business), Content analysis and Scope (project management) are investigated in conjunction with one another to address concerns in Tourism research.
A key indicator for each journal is its effectiveness in reaching other researchers with the papers published at that venue.
The chart below presents the interquartile range (first quartile 25%, median 50% and third quartile 75%) of the number of citations of articles over time.
The top authors publishing in IEEE Transactions on Reliability (based on the number of publications) are:
The overall trend for top authors publishing in this journal is outlined below. The chart shows the number of publications at each edition of the journal for top authors.
Only papers with recognized affiliations are considered
The top affiliations publishing in IEEE Transactions on Reliability (based on the number of publications) are:
The overall trend for top affiliations publishing in this journal is outlined below. The chart shows the number of publications at each edition of the journal for top affiliations.
The publication chance index shows the ratio of articles published by the best research institutions in the journal edition to all articles published within that journal. The best research institutions were selected based on the largest number of articles published during all editions of the journal.
The chart below presents the percentage ratio of articles from top institutions (based on their ranking of total papers).Top affiliations were grouped by their rank into the following tiers: top 1-10, top 11-20, top 21-50, and top 51+. Only articles with a recognized affiliation are considered.
During the most recent 2021 edition, 36.25% of publications had an unrecognized affiliation. Out of the publications with recognized affiliations, 6.85% were posted by at least one author from the top 10 institutions publishing in the journal. Another 3.63% included authors affiliated with research institutions from the top 11-20 affiliations. Institutions from the 21-50 range included 20.56% of all publications and 68.95% were from other institutions.
A very common phenomenon observed among researchers publishing scientific articles is the intentional selection of journals they have already attended in the past. In particular, it is worth analyzing the case when the authors participate in the same journal from year to year.
The Returning Authors Index presented below illustrates the ratio of authors who participated in both a given as well as the previous edition of the journal in relation to all participants in a given year.
The graph below shows the Returning Institution Index, illustrating the ratio of institutions that participated in both a given and the previous edition of the conference in relation to all affiliations present in a given year.
Our experience to innovation index was created to show a cross-section of the experience level of authors publishing in a journal. The index includes the authors publishing at the last edition of a journal, grouped by total number of publications throughout their academic career (P) and the total number of citations of these publications ever received (C).
The group intervals were selected empirically to best show the diversity of the authors' experiences, their labels were selected as a convenience, not as judgment. The authors were divided into the following groups:
The chart below illustrates experience levels of first authors in cases of publications with multiple authors.
Your interest in the topics discussed in the IEEE Transactions on Reliability journal could translate into a meaningful career. For instance, becoming a private school teacher specializing in Mathematics or Computer Science in West Virginia allows you to teach aspects of reliability theory, engineering, statistics and algorithm, as discussed in the journal. To understand the requirements, please visit this private school teacher requirements in West Virginia page.
On the other hand, those more interested in direct application of the featured topics might consider a career as a reliability engineer or statistician. Such professionals use insights from journals like IEEE Transactions on Reliability to solve real life problems. The knowledge of Weibull and Exponential distribution, and Estimation theory could be particularly valuable in these roles.
Finally, transitioning to an academic career might be attractive for those who are passionate about conducting research and contributing to areas like reliability theory. In this role, individuals can write articles similar to those published in the IEEE Transactions on Reliability journal and contribute to the broader field of Mathematical Optimization and Algorithm.
Mojtaba Kordestani;Mehrdad Saif;Marcos E. Orchard;Roozbeh Razavi-Far
(2021)Unknown
(2023)Yun Lin;Haojun Zhao;Xuefei Ma;Ya Tu
(2021)Mohamed Elhoseny;K. Shankar
(2020)Meiyu Wang;Yun Lin;Qiao Tian;Guangzhen Si
(2021)Unknown
(2023)J. Uthayakumar;Mohamed Elhoseny;K. Shankar
(2020)Jinhui Wu;Dequan Zhang;Jie Liu;Xu Han
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