SPIE Optical Metrology 2027 — Multimodal Sensing and Artificial Intelligence for Sustainable Future (MSAISF)

SPIE conference within the biennial SPIE Optical Metrology meeting in Munich on multimodal sensing combined with AI. It invites original contributions on multimodal sensing, optical sensors, sensor fusion, machine learning for sensing, optical metrology, environmental monitoring, industrial inspection. Submissions may take the form of full research papers, extended abstracts and poster presentations reporting theoretical, computational and experimental work, as well as industrial case studies and applications. The meeting brings together researchers, engineers, industry practitioners and students to exchange recent results and discuss emerging directions in the field. Accepted papers are published in the Proceedings of SPIE.