Critical Reviews in Solid State and Materials Sciences

Top Research Topics at Critical Reviews in Solid State and Materials Sciences?

The journal covers a variety of subjects, including Nanotechnology, Optoelectronics, Semiconductor, Condensed matter physics and Thin film. The work tackled in Critical Reviews in Solid State and Materials Sciences goes beyond the discipline of Nanotechnology as it also encompasses Oxide. The study on Optoelectronics presented in the journal intersects with subjects under the field of Epitaxy.

• Nanotechnology (25.67%)
• Optoelectronics (15.02%)
• Semiconductor (10.08%)

What are the most cited papers published in the journal?

• Synthesis of Graphene and Its Applications: A Review (1127 citations)
• Oxide Materials for Development of Integrated Gas Sensors—A Comprehensive Review (832 citations)
• Zero-Valent Iron Nanoparticles for Abatement of Environmental Pollutants: Materials and Engineering Aspects (795 citations)

Research areas of the most cited articles at Critical Reviews in Solid State and Materials Sciences:

The most cited papers tackle a plethora of topics, such as Nanotechnology, Thin film, Semiconductor, Condensed matter physics and Composite material. The most cited publications focus on Nanotechnology but the discussions also offer insight into other areas such as Biocompatibility and Oxide. The journal publications address concerns in Thin film which are intertwined with other disciplines, such as Optoelectronics, Mineralogy, Optics and Analytical chemistry.

What topics the last edition of the journal is best known for?

• Quantum mechanics
• Electron
• Composite material

The previous edition focused in particular on these issues:

The concepts of Nanotechnology, Optoelectronics, Graphene, Chemical engineering and Metal are tackled in the journal. Nanotechnology research presented in Critical Reviews in Solid State and Materials Sciences encompasses a variety of subjects, including Photocatalysis and Photovoltaics. It facilitates discussions on Optoelectronics that incorporate concepts from other fields like Matrix (mathematics), Emission spectrum and Thin film.

Anti-corrosion and Electronics are some topics wherein Graphene research discussed in the journal have an impact. The Chemical engineering research discussed in Critical Reviews in Solid State and Materials Sciences can contribute to the expansion of the discourse in closely related subjects like

• Thermal that connect with fields like Titanium alloy, Carbon nanotube, Polymer, Catalysis and Electrochemistry,
• Adsorption and related Spinel and Ion.. Metal research featured in it incorporates concerns from various other topics such as Composite material, Pressing, Molecular dynamics and Powder metallurgy.

The most cited articles from the last journal are:

• A review of the current status of graphitic carbon nitride (35 citations)
• Cutting edge development on graphene derivatives modified by liquid crystal and CdS/TiO2 hybrid matrix: optoelectronics and biotechnological aspects (30 citations)
• Interfacial engineering revolutionizers: perovskite nanocrystals and quantum dots accentuated performance enhancement in perovskite solar cells (14 citations)

Papers citation over time

A key indicator for each journal is its effectiveness in reaching other researchers with the papers published at that venue.

The chart below presents the interquartile range (first quartile 25%, median 50% and third quartile 75%) of the number of citations of articles over time.

Top authors and change over time

The top authors publishing in Critical Reviews in Solid State and Materials Sciences (based on the number of publications) are:

• Cuie Wen (5 papers) absent at the last edition,
• Ghenadii Korotcenkov (4 papers) absent at the last edition,
• Indranil Lahiri (4 papers) absent at the last edition,
• Beongki Cho (4 papers) absent at the last edition,
• Md. Abul Kalam (3 papers) absent at the last edition.

The overall trend for top authors publishing in this journal is outlined below. The chart shows the number of publications at each edition of the journal for top authors.

Top affiliations and change over time

Only papers with recognized affiliations are considered

The top affiliations publishing in Critical Reviews in Solid State and Materials Sciences (based on the number of publications) are:

• Bell Labs (11 papers) absent at the last edition,
• University of Malaya (9 papers) published 2 papers at the last edition, 1 more than at the previous edition,
• University of Florida (9 papers) absent at the last edition,
• IBM (8 papers) absent at the last edition,
• University of British Columbia (6 papers) published 2 papers at the last edition the same number as at the previous edition.

The overall trend for top affiliations publishing in this journal is outlined below. The chart shows the number of publications at each edition of the journal for top affiliations.

Publication chance based on affiliation

The publication chance index shows the ratio of articles published by the best research institutions in the journal edition to all articles published within that journal. The best research institutions were selected based on the largest number of articles published during all editions of the journal.

The chart below presents the percentage ratio of articles from top institutions (based on their ranking of total papers).Top affiliations were grouped by their rank into the following tiers: top 1-10, top 11-20, top 21-50, and top 51+. Only articles with a recognized affiliation are considered.

During the most recent 2021 edition, 4.65% of publications had an unrecognized affiliation. Out of the publications with recognized affiliations, 14.63% were posted by at least one author from the top 10 institutions publishing in the journal. Another 9.76% included authors affiliated with research institutions from the top 11-20 affiliations. Institutions from the 21-50 range included 21.95% of all publications and 53.66% were from other institutions.

Returning Authors Index

A very common phenomenon observed among researchers publishing scientific articles is the intentional selection of journals they have already attended in the past. In particular, it is worth analyzing the case when the authors participate in the same journal from year to year.

The Returning Authors Index presented below illustrates the ratio of authors who participated in both a given as well as the previous edition of the journal in relation to all participants in a given year.

Returning Institution Index

The graph below shows the Returning Institution Index, illustrating the ratio of institutions that participated in both a given and the previous edition of the conference in relation to all affiliations present in a given year.

The experience to innovation index

Our experience to innovation index was created to show a cross-section of the experience level of authors publishing in a journal. The index includes the authors publishing at the last edition of a journal, grouped by total number of publications throughout their academic career (P) and the total number of citations of these publications ever received (C).

The group intervals were selected empirically to best show the diversity of the authors' experiences, their labels were selected as a convenience, not as judgment. The authors were divided into the following groups:

• Novice - P < 5 or C < 25 (the number of publications less than 5 or the number of citations less than 25),
• Competent - P < 10 or C < 100 (the number of publications less than 10 or the number of citations less than 100),
• Experienced - P < 25 or C < 625 (the number of publications less than 25 or the number of citations less than 625),
• Master - P < 50 or C < 2500 (the number of publications less than 50 or the number of citations less than 2500),
• Star - P ≥ 50 and C ≥ 2500 (both the number of publications greater than 50 and the number of citations greater than 2500).

The chart below illustrates experience levels of first authors in cases of publications with multiple authors.