D-Index & Metrics Best Publications

D-Index & Metrics D-index (Discipline H-index) only includes papers and citation values for an examined discipline in contrast to General H-index which accounts for publications across all disciplines.

Discipline name D-index D-index (Discipline H-index) only includes papers and citation values for an examined discipline in contrast to General H-index which accounts for publications across all disciplines. Citations Publications World Ranking National Ranking
Engineering and Technology D-index 30 Citations 3,682 208 World Ranking 7937 National Ranking 61

Overview

What is he best known for?

The fields of study he is best known for:

  • Semiconductor
  • Oxygen
  • Silicon

Analytical chemistry, Annealing, Thin film, Electrical resistivity and conductivity and Condensed matter physics are his primary areas of study. His research on Analytical chemistry focuses in particular on Auger electron spectroscopy. The Annealing study combines topics in areas such as Silicide, Atmospheric temperature range and Microelectronics.

The concepts of his Thin film study are interwoven with issues in Tungsten, Cobalt, Mineralogy, Copper and Nanocrystalline material. His Electrical resistivity and conductivity research includes elements of Grain boundary, Carbon film, Titanium nitride, Sheet resistance and X-ray photoelectron spectroscopy. His Condensed matter physics study incorporates themes from Thermionic emission, Schottky diode and Schottky barrier.

His most cited work include:

  • Carbon monolayer phase condensation on Ni(111) (381 citations)
  • Uniform tungsten silicide films produced by chemical vapor deposition (215 citations)
  • Interfacial reactions between Ni films and GaAs (112 citations)

What are the main themes of his work throughout his whole career to date?

His main research concerns Analytical chemistry, Annealing, Optoelectronics, Thin film and Silicon. His studies in Analytical chemistry integrate themes in fields like Transmission electron microscopy, Substrate and Epitaxy. His Annealing research is multidisciplinary, incorporating elements of Amorphous solid, Electrical resistivity and conductivity and Atomic layer deposition.

His research investigates the link between Optoelectronics and topics such as Metal that cross with problems in Oxide. His Thin film study combines topics from a wide range of disciplines, such as Cobalt, Chemical vapor deposition and Mineralogy. His studies deal with areas such as Rutherford backscattering spectrometry, Ion beam, Composite material and Schottky barrier as well as Silicon.

He most often published in these fields:

  • Analytical chemistry (41.38%)
  • Annealing (26.90%)
  • Optoelectronics (23.79%)

What were the highlights of his more recent work (between 2012-2021)?

  • Optoelectronics (23.79%)
  • Dielectric (16.55%)
  • Annealing (26.90%)

In recent papers he was focusing on the following fields of study:

His primary areas of study are Optoelectronics, Dielectric, Annealing, Atomic layer deposition and Analytical chemistry. His Optoelectronics research integrates issues from Transistor, Metal and Capacitor. His Dielectric study which covers Gate dielectric that intersects with Dielectric strength.

His primary area of study in Annealing is in the field of Forming gas. He interconnects Titanium nitride, Nitride, Tin and Electrical resistivity and conductivity in the investigation of issues within Atomic layer deposition. His work in Analytical chemistry is not limited to one particular discipline; it also encompasses Titanium.

Between 2012 and 2021, his most popular works were:

  • New method for determining flat-band voltage in high mobility semiconductors (64 citations)
  • Indium outdiffusion and leakage degradation in metal/Al2O3/In0.53Ga0.47As capacitors (29 citations)
  • The physical origin of dispersion in accumulation in InGaAs based metal oxide semiconductor gate stacks (29 citations)

In his most recent research, the most cited papers focused on:

  • Semiconductor
  • Oxygen
  • Aluminium

Moshe Eizenberg mainly investigates Optoelectronics, Dielectric, Annealing, Gallium arsenide and Analytical chemistry. His Optoelectronics research incorporates themes from Van der Pauw method, Transient, Electron capture and Capacitor. His research integrates issues of Electronic band structure and Band offset in his study of Dielectric.

Moshe Eizenberg has researched Annealing in several fields, including Oxide, Indium and Atomic layer deposition. His work deals with themes such as Dispersion and Metal, which intersect with Gallium arsenide. His Analytical chemistry study is mostly concerned with Electrical measurements and X-ray photoelectron spectroscopy.

This overview was generated by a machine learning system which analysed the scientist’s body of work. If you have any feedback, you can contact us here.

Best Publications

Uniform tungsten silicide films produced by chemical vapor deposition

Susan G. Telford;Meng Chu Tseng;Michio Aruga;Moshe Eizenberg.
Journal of Fluorine Chemistry (1995)

325 Citations

Carbon interaction with nickel surfaces: Monolayer formation and structural stability

M. Eizenberg;J. M. Blakely.
Journal of Chemical Physics (1979)

177 Citations

Characterization of electroless deposited Co(W,P) thin films for encapsulation of copper metallization

A. Kohn;M. Eizenberg;Y. Shacham-Diamand;Y. Sverdlov.
Materials Science and Engineering A-structural Materials Properties Microstructure and Processing (2001)

161 Citations

Annealing-induced interfacial toughening using a molecular nanolayer

Darshan D. Gandhi;Michael Lane;Yu Zhou;Amit P. Singh.
Nature (2007)

150 Citations

Interlayer dielectrics for semiconductor technologies

S. P. Murarka;M. Eizenberg;A. K. Sinha.
(2003)

107 Citations

TiCN: A new chemical vapor deposited contact barrier metallization for submicron devices

M. Eizenberg;K. Littau;S. Ghanayem;A. Mak.
Applied Physics Letters (1994)

103 Citations

New method for determining flat-band voltage in high mobility semiconductors

Roy Winter;Jaesoo Ahn;Paul C. McIntyre;Moshe Eizenberg.
Journal of Vacuum Science & Technology B (2013)

101 Citations

Evaluation of electroless deposited Co(W,P) thin films as diffusion barriers for copper metallization

A. Kohn;M. Eizenberg;Y. Shacham-Diamand;B. Israel.
Microelectronic Engineering (2000)

94 Citations

Atomic layer deposition of tungsten film from WF6/B2H6: Nucleation layer for advanced semiconductor devices

Michael Yang;Hua Chung;Alex Yoon;Hongbin Fang.
Advanced Metallization Conference 2001 (AMC 2001) (2001)

91 Citations

Chemical vapor deposited TiCN: A new barrier metallization for submicron via and contact applications

M. Eizenberg;K. Littau;S. Ghanayem;M. Liao.
Journal of Vacuum Science and Technology (1995)

89 Citations

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