McMaster University
Canada
Electronic engineering, Transistor, MOSFET, Optoelectronics and CMOS are his primary areas of study. M.J. Deen has researched Electronic engineering in several fields, including Standby power, Radio frequency, Semiconductor, Electrical engineering and Noise temperature. His studies deal with areas such as Electronic circuit, Nanotechnology and Thin-film transistor as well as Transistor.
His MOSFET research is multidisciplinary, incorporating perspectives in Noise, Noise measurement, Noise and Communication channel. M.J. Deen usually deals with Optoelectronics and limits it to topics linked to Subthreshold slope and Depletion region. His studies in CMOS integrate themes in fields like Gate equivalent, Photodetector, NQS, Gate resistance and LC circuit.
M.J. Deen focuses on Optoelectronics, Electronic engineering, Transistor, Electrical engineering and CMOS. His Optoelectronics study integrates concerns from other disciplines, such as Avalanche photodiode, Field-effect transistor, Flicker noise, Noise and MOSFET. In his research, Condensed matter physics is intimately related to Biasing, which falls under the overarching field of MOSFET.
His research in Electronic engineering tackles topics such as Noise figure which are related to areas like Low-noise amplifier. His Transistor research is multidisciplinary, incorporating elements of Spice, Nanotechnology and Thin-film transistor. His CMOS study deals with Image sensor intersecting with Pixel.
His scientific interests lie mostly in Optoelectronics, Transistor, Thin-film transistor, Nanotechnology and Electronic engineering. His Optoelectronics study incorporates themes from Field-effect transistor, Flicker noise and Infrasound. His biological study spans a wide range of topics, including Noise, Electrical engineering and Burst noise.
Many of his studies on Transistor apply to Biasing as well. In the field of Nanotechnology, his study on Biosensor and Wafer overlaps with subjects such as Fabrication. A large part of his Electronic engineering studies is devoted to CMOS.
His main research concerns Transistor, Optoelectronics, Thin-film transistor, Electronic engineering and Nanotechnology. His Transistor research includes elements of Semiconductor and Active layer. The study incorporates disciplines such as Charge, Charge density and Mobility model in addition to Optoelectronics.
His research in Thin-film transistor intersects with topics in Electron mobility, Charge carrier mobility, Organic electronics, Voltage and Threshold voltage. His study of CMOS is a part of Electronic engineering. His Nanotechnology research is multidisciplinary, relying on both Working electrode and Junction formation.
This overview was generated by a machine learning system which analysed the scientist’s body of work. If you have any feedback, you can contact us here.
A wireless wearable ECG sensor for long-term applications
E. Nemati;M. J. Deen;T. Mondal.
IEEE Communications Magazine (2012)
Organic Thin-Film Transistors: Part I—Compact DC Modeling
O. Marinov;M.J. Deen;U. Zschieschang;H. Klauk.
IEEE Transactions on Electron Devices (2009)
An effective gate resistance model for CMOS RF and noise modeling
Xiaodong Jin;Jia-Jiunn Ou;Chih-Hung Chen;Weidong Liu.
international electron devices meeting (1998)
A low-noise, low-power VCO with automatic amplitude control for wireless applications
M.A. Margarit;Joo Leong Tham;R.G. Meyer;M.J. Deen.
IEEE Journal of Solid-state Circuits (1999)
Model for the field effect from layers of biological macromolecules on the gates of metal-oxide-semiconductor transistors
D. Landheer;G. Aers;W. R. McKinnon;M. J. Deen.
Journal of Applied Physics (2005)
A review of gate tunneling current in MOS devices
Juan C. Ranuárez;M.J. Deen;Chih-Hung Chen.
Microelectronics Reliability (2006)
MOSFET modeling for RF IC design
Yuhua Cheng;M.J. Deen;Chih-Hung Chen.
IEEE Transactions on Electron Devices (2005)
Fully Integrated Single Photon Avalanche Diode Detector in Standard CMOS 0.18- $\mu$ m Technology
N. Faramarzpour;M.J. Deen;S. Shirani;Qiyin Fang.
IEEE Transactions on Electron Devices (2008)
Channel noise modeling of deep submicron MOSFETs
Chih-Hung Chen;M.J. Deen.
IEEE Transactions on Electron Devices (2002)
Extraction of the induced gate noise, channel noise, and their correlation in submicron MOSFETs from RF noise measurements
Chih-Hung Chen;M.J. Deen;Yuhua Cheng;M. Matloubian.
IEEE Transactions on Electron Devices (2001)
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