Andreas Stemmer focuses on Optics, Nanotechnology, Non-contact atomic force microscopy, Microscopy and Conductive atomic force microscopy. His study in Kelvin probe force microscope, Diffraction efficiency, Scanning probe microscopy, Guided-mode resonance and Grating is done as part of Optics. His Kelvin probe force microscope research incorporates elements of Ab initio, Resolution, Ab initio quantum chemistry methods and Work function.
The study incorporates disciplines such as Quality, Microscope and Atomic physics in addition to Nanotechnology. Andreas Stemmer interconnects Cantilever, Resonance, Excitation and Tapping in the investigation of issues within Non-contact atomic force microscopy. His research investigates the connection between Conductive atomic force microscopy and topics such as Atomic force acoustic microscopy that intersect with problems in Electrostatic force microscope, Feed forward, Scanning capacitance microscopy, Control theory and Control theory.
The scientist’s investigation covers issues in Optics, Nanotechnology, Microscopy, Kelvin probe force microscope and Optoelectronics. His research related to Non-contact atomic force microscopy, Resolution, Microscope, Diffraction grating and Scanning probe microscopy might be considered part of Optics. Andreas Stemmer focuses mostly in the field of Non-contact atomic force microscopy, narrowing it down to matters related to Cantilever and, in some cases, Excitation and Scanner.
The Nanotechnology study combines topics in areas such as Nanolithography and Composite material. Chemical physics and Electret is closely connected to Analytical chemistry in his research, which is encompassed under the umbrella topic of Microscopy. In his research on the topic of Kelvin probe force microscope, Atomic force acoustic microscopy and Electrostatic force microscope is strongly related with Conductive atomic force microscopy.
His primary areas of study are Nanotechnology, Thin film, Chemical engineering, Nanoparticle and Electron transfer. Nanotechnology is closely attributed to Integrated circuit in his work. His Thin film research is multidisciplinary, relying on both Nanoporous, Fullerene, Monolayer and Silicon.
His studies deal with areas such as Scanning thermal microscopy, Electrochemistry, Bilirubin oxidase and Biosensor as well as Chemical engineering. His work in Electron transfer addresses issues such as Anode, which are connected to fields such as Glucose oxidase. His work deals with themes such as Vibrational analysis with scanning probe microscopy, Scanning ion-conductance microscopy, Scanning capacitance microscopy and Scanning confocal electron microscopy, which intersect with Scanning probe microscopy.
His primary areas of investigation include Chemical engineering, Anode, Nanoparticle, Electron transfer and Bilirubin oxidase. His Chemical engineering study frequently links to related topics such as Glucose oxidase. Glucose oxidase and Substrate are two areas of study in which Andreas Stemmer engages in interdisciplinary research.
Many of his research projects under Nanoparticle are closely connected to Degradation with Degradation, tying the diverse disciplines of science together. His studies in Electron transfer integrate themes in fields like Electrochemistry and Overpotential. His Bilirubin oxidase study integrates concerns from other disciplines, such as Inorganic chemistry, Biofuel, Oxygen and Hydrogen peroxide.
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Resolution and contrast in Kelvin probe force microscopy
H. O. Jacobs;P. Leuchtmann;O. J. Homan;A. Stemmer.
Journal of Applied Physics (1998)
High performance feedback for fast scanning atomic force microscopes
G. Schitter;P. Menold;H. F. Knapp;F. Allgöwer.
Review of Scientific Instruments (2001)
True optical resolution beyond the Rayleigh limit achieved by standing wave illumination.
Jan T. Frohn;Helmut F. Knapp;Andreas Stemmer.
Proceedings of the National Academy of Sciences of the United States of America (2000)
Surface potential mapping: A qualitative material contrast in SPM
H.O. Jacobs;H.F. Knapp;S. Müller;A. Stemmer.
Practical aspects of Kelvin probe force microscopy
H. O. Jacobs;H. F. Knapp;A. Stemmer.
Review of Scientific Instruments (1999)
Synthesis of Free‐Standing, Monolayered Organometallic Sheets at the Air/Water Interface
Thomas Bauer;Zhikun Zheng;Alois Renn;Raoul Enning.
Angewandte Chemie (2011)
Identification and open-loop tracking control of a piezoelectric tube scanner for high-speed scanning-probe microscopy
G. Schitter;A. Stemmer.
IEEE Transactions on Control Systems and Technology (2004)
A new control strategy for high-speed atomic force microscopy
G Schitter;F Allgöwer;A Stemmer.
Variations in the work function of doped single- and few-layer graphene assessed by Kelvin probe force microscopy and density functional theory
D. Ziegler;P. Gava;J. Güttinger;F. Molitor.
Physical Review B (2011)
Temperature mapping of operating nanoscale devices by scanning probe thermometry.
Fabian Menges;Philipp Mensch;Heinz Schmid;Heike Riel.
Nature Communications (2016)
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