Ranking & Metrics Conference Call for Papers Other Conferences in United States
MED 2022 : Mediterranean Conference on Control and Automation

MED 2022 : Mediterranean Conference on Control and Automation

Athens, Greece

Submission Deadline: Tuesday 01 Feb 2022

Conference Dates: Jun 28, 2022 - Jul 01, 2022

Impact Score 1.81


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Ranking & Metrics Impact Score is a novel metric devised to rank conferences based on the number of contributing top scientists in addition to the h-index estimated from the scientific papers published by top scientists. See more details on our methodology page.

Research Impact Score: 1.81
Contributing Top Scientist: 23
Papers published by Top Scientists 53
Research Ranking (Computer Science) 533

Conference Call for Papers

Papers: The paper format must follow IEEE paper submission rules, two-column format using 10-point fonts, Times New Roman. The maximum number of pages per submitted paper is 6. Up to two additional pages will be permitted for an additional charge. Illustrations and references are included in the page count.

Invited Sessions: Proposals for invited sessions should contain a summary statement describing the motivation and relevance of the proposed session, the invited paper titles and the names of the authors. Authors must submit FULL invited papers. Each paper must be marked as “Invited Session Paper”.

Workshops and Tutorials: Proposals for workshops and tutorials should contain title, list of speakers, and extended summaries (2000 words) of their presentations.

All contributions (papers, invited papers, proposals for invited sessions, workshops, and tutorials) must be submitted electronically through PaperCept by February 1, 2022.

Review: All submitted papers will undergo a peer review process coordinated by the Program Chairs, Advisory Committee Members, IPC members and qualified reviewers. Authors will be notified of results at the latest by April 15, 2022. Accepted papers must be uploaded electronically no later than May 10, 2022.Accepted and presented papers will be published in IEEE Xplore.
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