Ranking & Metrics Conference Call for Papers Other Conferences in United States
International Solid-State Circuits Conference

International Solid-State Circuits Conference

San Francisco, United States

Submission Deadline: Wednesday 07 Sep 2022

Conference Dates: Feb 19, 2023 - Feb 23, 2023

Research
Impact Score 6.70

OFFICIAL WEBSITE

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Ranking & Metrics Impact Score is a novel metric devised to rank conferences based on the number of contributing the best scientists in addition to the h-index estimated from the scientific papers published by the best scientists. See more details on our methodology page.

Research Impact Score: 6.70
Contributing Best Scientists: 132
H5-index:
Papers published by Best Scientists 342
Research Ranking (Electronics and Electrical Engineering) 3
Research Ranking (Materials Science) 43

Conference Call for Papers

Innovative and original papers are solicited in subject areas including (but not limited to) the following:
ANALOG: Circuits with analog-dominated innovation; amplifiers, comparators, oscillators, filters, references; nonlinear analog circuits; digitally
assisted analog circuits; Sensor interface circuits; analog circuits in sub-10nm scaled technologies.
DATA CONVERTERS: Nyquist-rate and oversampling A/D and D/A converters; embedded and application-specific A/D and D/A converters; timeto-digital converters; innovative and emerging converter architectures.
DIGITAL CIRCUITS, ARCHITECTURES & SYSTEMS*: Digital circuits, building blocks, and complete systems (monolithic, 2.5D, and 3D) for
microprocessors, micro-controllers, application processors, graphics processors, automotive processors; digital systems for communications,
video and multimedia, cryptography, smart cards, security and trusted computing, accelerators, reconfigurable systems, near- and sub-threshold
systems, and emerging applications. Digital circuits for intra-chip communication, clock distribution, soft-error and variation-tolerant design,
power management (i.e., voltage regulators, adaptive digital circuits, digital sensors), digital PLLs for processors, neurocomputing with a focus
on digital-circuit techniques, and security circuits (i.e., PUFs, TRNGs, side-channel attack countermeasures, and attack-detection sensors).
IMAGERS, MEMS, MEDICAL, & DISPLAY: Image sensors and SoCs; automotive, LIDAR; ultrasound and medical imaging; MEMS sensor and
actuators; wearable, implantable, ingestible devices; biomedical SoCs, neural interfaces and closed-loop systems; body area networks; biosensors,
microarrays; display drivers, sensing or haptic displays; sensing and displays for AR/VR.
MACHINE LEARNING AND AI: Chips demonstrating system, architecture and circuit innovations for machine learning and artificial intelligence:
SoCs, chiplets, multi-chip solutions, processor architectures, accelerators and analog/digital circuits; near-sensor and in-sensor processing
schemes; all architectures and circuits leveraging near-memory and in-memory computation with system and SOC level innovations for AI using
volatile or non-volatile memories. Hardware optimizations for new ML models including transformers, graph neural networks, hyper-dimensional
computing, spiking neural networks and applications including mobile, wearables, data centers and autonomous driving, etc.
MEMORY: Macros for near-memory compute and in-memory-compute across various applications; Static, dynamic, and non-volatile memories
for stand-alone and embedded applications; memory/SSD controllers; high bandwidth I/O interfaces for memory; memories based on phasechange, magnetic, spin-transfer-torque, ferroelectric, and resistive materials; array architectures and circuits to improve low-voltage operation,
power reduction, reliability, and fault tolerance; 3D memory circuits for memory-memory and memory-logic stacking; error correction and yield
enhancement schemes for memories; application-specific circuit enhancements within the memory subsystem.
POWER MANAGEMENT: Power management and control circuits, regulators; switched-mode power converter ICs using inductive, capacitive,
and hybrid techniques; energy harvesting circuits and systems; wide-bandgap topologies and gate-drivers; power and signal isolators; robust
power management circuits for automotive and other harsh environments; circuits for lighting, wireless power and envelope modulators.
RF CIRCUITS and WIRELESS SYSTEMS**: Building blocks and complete solutions at RF, mm-Wave and THz frequencies for receivers,
transmitters, frequency synthesizers, RF filters, transceivers, SoCs, and SiPs. Innovative circuit, system and packaging solutions for established
wireless standards as well as future systems or applications, such as radar, sensing and imaging and those improving spectral and energy
efficiency.
TECHNOLOGY DIRECTIONS: Emerging and novel IC, system, and device solutions in various areas such as integrated photonics, silicon
electronics-photonics integration, optical phased and focal plane arrays; quantum devices for metrology, computing, etc.; flexible, stretchable,
foldable, printable, and 3D electronic systems; biomedical sensors for cellular and molecular targets; wireless power transfer at-distance (e.g.,
RF and mm-wave, optical, ultrasonic); novel platforms for non-CMOS computing and machine learning; integrated meta-materials, circuits in
alternative device platforms (e.g., carbon, organic, superconductor, spin, etc.).
WIRELINE: Receivers/transmitters/transceivers for wireline systems, including backplane transceivers, copper-cable links, chip-to-chip
communications, 2.5/3D interconnect, on-chip links, optical links, and silicon photonics; exploratory I/O circuits for advancing data rates,
bandwidth density, power efficiency, equalization, robustness, adaptation capability, and design methodology; building blocks for wireline
transceivers (including but not limited to AGCs, analog and ADC/DAC-based front ends, TIAs, equalizers, clock generation and distribution
circuits including PLLs, clock recovery, line drivers, and hybrids).

Overview

Top Research Topics at International Solid-State Circuits Conference?

  • Electronic engineering (48.11%)
  • Electrical engineering (43.02%)
  • CMOS (32.60%)

The conference generally zeroes in on subjects such as Electronic engineering, Electrical engineering, CMOS, Computer hardware and Optoelectronics. Electronic engineering research presented in International Solid-State Circuits Conference encompasses a variety of subjects, including Phase-locked loop, Electronic circuit, Chip and Transceiver. Research on Electrical engineering addressed in the conference frequently intersections with the field of Power (physics).

The research on CMOS tackled can also make contributions to studies in the areas of Phase noise, Jitter, Low-power electronics, Integrated circuit and Transmitter. International Solid-State Circuits Conference connects the study in Computer hardware with the closely related area of Embedded system. The Optoelectronics research dealing mostly with Diode is the focus of International Solid-State Circuits Conference.

What are the most cited papers published at the conference?

  • Direct-conversion radio transceivers for digital communications (1000 citations)
  • Low-jitter and process independent DLL and PLL based on self biased techniques (962 citations)
  • A dynamic voltage scaled microprocessor system (891 citations)

Research areas of the most cited articles at International Solid-State Circuits Conference:

The most cited papers focus largely on the fields of Electronic engineering, CMOS, Electrical engineering, Chip and Low-power electronics. The most cited publications feature studies on Electronic engineering, including topics such as Bandwidth (signal processing). The study of CMOS in the conference papers encompasses disciplines such as Computer hardware, as well as fields such as Embedded system, all of which overlap with one another.

What topics the last edition of the conference is best known for?

  • Quantum mechanics
  • Operating system
  • Electrical engineering

The previous edition focused in particular on these issues:

International Solid-State Circuits Conference mainly tackles studies in Electrical engineering, CMOS, Electronic engineering, Power (physics) and Amplifier. The research on Electrical engineering featured in it combines topics in other fields like Wireless and Bandwidth (computing). The event deals with Wireless in conjunction with Session (computer science) and similar fields in Computer architecture.

The overlapping concepts between Transceiver and Radio frequency are the key highlights of CMOS study. The Electronic engineering works featured in the conference incorporate elements from Phase-locked loop, MIMO and Noise. The study of Topology and how it intertwines with concepts under Linearity were explored in the presented Power (physics) research.

The most cited articles from the last conference are:

  • 25.4 A 20nm 6GB Function-In-Memory DRAM, Based on HBM2 with a 1.2TFLOPS Programmable Computing Unit Using Bank-Level Parallelism, for Machine Learning Applications (10 citations)
  • 16.3 A 28nm 384kb 6T-SRAM Computation-in-Memory Macro with 8b Precision for AI Edge Chips (6 citations)
  • A Programmable Neural-Network Inference Accelerator Based on Scalable In-Memory Computing (6 citations)

Papers citation over time

A key indicator for each conference is its effectiveness in reaching other researchers with the papers published at that venue.

The chart below presents the interquartile range (first quartile 25%, median 50% and third quartile 75%) of the number of citations of articles over time.

Research.com

The top authors publishing at International Solid-State Circuits Conference (based on the number of publications) are:

  • Kofi A. A. Makinwa (45 papers) published 7 papers at the last edition, 4 more than at the previous edition,
  • Anantha P. Chandrakasan (42 papers) published 1 paper at the last edition the same number as at the previous edition,
  • Dennis Sylvester (39 papers) published 2 papers at the last edition the same number as at the previous edition,
  • David Blaauw (37 papers) published 2 papers at the last edition the same number as at the previous edition,
  • Hoi-Jun Yoo (30 papers) absent at the last edition.

The overall trend for top authors publishing at this conference is outlined below. The chart shows the number of publications at each edition of the conference for top authors.

Research.com

Only papers with recognized affiliations are considered

The top affiliations publishing at International Solid-State Circuits Conference (based on the number of publications) are:

  • Intel (173 papers) published 22 papers at the last edition, 11 more than at the previous edition,
  • Samsung (152 papers) published 29 papers at the last edition, 12 more than at the previous edition,
  • IBM (120 papers) published 8 papers at the last edition, 6 more than at the previous edition,
  • Katholieke Universiteit Leuven (110 papers) published 9 papers at the last edition, 3 more than at the previous edition,
  • KAIST (102 papers) published 11 papers at the last edition, 5 more than at the previous edition.

The overall trend for top affiliations publishing at this conference is outlined below. The chart shows the number of publications at each edition of the conference for top affiliations.

Research.com

Publication chance based on affiliation

The publication chance index shows the ratio of articles published by the best research institutions at the conference edition to all articles published within that conference. The best research institutions were selected based on the largest number of articles published during all editions of the conference.

The chart below presents the percentage ratio of articles from top institutions (based on their ranking of total papers).Top affiliations were grouped by their rank into the following tiers: top 1-10, top 11-20, top 21-50, and top 51+. Only articles with a recognized affiliation are considered.

Research.com

During the most recent 2021 edition, 5.49% of publications had an unrecognized affiliation. Out of the publications with recognized affiliations, 39.42% were posted by at least one author from the top 10 institutions publishing at the conference. Another 12.86% included authors affiliated with research institutions from the top 11-20 affiliations. Institutions from the 21-50 range included 27.39% of all publications and 20.33% were from other institutions.

Returning Authors Index

A very common phenomenon observed among researchers publishing scientific articles is the intentional selection of conferences they have already attended in the past. In particular, it is worth analyzing the case when the authors participate in the same conference from year to year.

The Returning Authors Index presented below illustrates the ratio of authors who participated in both a given as well as the previous edition of the conference in relation to all participants in a given year.

Research.com

Returning Institution Index

The graph below shows the Returning Institution Index, illustrating the ratio of institutions that participated in both a given and the previous edition of the conference in relation to all affiliations present in a given year.

Research.com

The experience to innovation index

Our experience to innovation index was created to show a cross-section of the experience level of authors publishing at a conference. The index includes the authors publishing at the last edition of a conference, grouped by total number of publications throughout their academic career (P) and the total number of citations of these publications ever received (C).

The group intervals were selected empirically to best show the diversity of the authors' experiences, their labels were selected as a convenience, not as judgment. The authors were divided into the following groups:

  • Novice - P < 5 or C < 25 (the number of publications less than 5 or the number of citations less than 25),
  • Competent - P < 10 or C < 100 (the number of publications less than 10 or the number of citations less than 100),
  • Experienced - P < 25 or C < 625 (the number of publications less than 25 or the number of citations less than 625),
  • Master - P < 50 or C < 2500 (the number of publications less than 50 or the number of citations less than 2500),
  • Star - P ≥ 50 and C ≥ 2500 (both the number of publications greater than 50 and the number of citations greater than 2500).

Research.com

The chart below illustrates experience levels of first authors in cases of publications with multiple authors.

Research.com

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Previous Editions

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