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28th IEEE European Test Symposium

28th IEEE European Test Symposium

Venice & Online , Italy

Submission Deadline: Thursday 08 Dec 2022

Conference Dates: May 22, 2023 - May 26, 2023

Research
Impact Score 1.30

OFFICIAL WEBSITE

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Ranking & Metrics Impact Score is a novel metric devised to rank conferences based on the number of contributing the best scientists in addition to the h-index estimated from the scientific papers published by the best scientists. See more details on our methodology page.

Research Impact Score: 1.30
Contributing Best Scientists: 14
H5-index:
Papers published by Best Scientists 31
Research Ranking (Computer Science) 646
Research Ranking (Electronics and Electrical Engineering) 179

Conference Call for Papers

The IEEE European Test Symposium (ETS) 2023 seeks original, unpublished contributions
of the following types:
• Scientific Papers, up to 6 pages, for inclusion in the Formal IEEE Proceedings
• Industrial Papers, up to 6 pages, for inclusion in the Informal Digest of Papers
• Fringe Workshops proposals about relevant and timely topics.

Overview

Top Research Topics at European Test Symposium?

  • Electronic engineering (29.33%)
  • Embedded system (23.12%)
  • Automatic test pattern generation (14.94%)

The conference generally zeroes in on subjects such as Electronic engineering, Embedded system, Automatic test pattern generation, Fault (power engineering) and Built-in self-test. The research on Electronic engineering tackled can also make contributions to studies in the areas of Design for testing and Electronic circuit, Electrical engineering. The conference holds forums on Embedded system that merges themes from other disciplines such as System testing, Automatic test equipment and Fault tolerance.

While the conference focused on Automatic test pattern generation, it was also able to explore topics like Algorithm, Reliability engineering, Computer engineering and Fault coverage. The studies in Fault coverage featured incorporate elements of Real-time computing and Stuck-at fault. While Stuck-at fault is the focus of the event, it also provided insights into the studies of Fault indicator and Fault model.

Fault detection and isolation is part of Fault (power engineering) studies tackled in the event. The Test compression study featured in it draws parallels with the field of Test data.

What are the most cited papers published at the conference?

  • Approximate computing: An emerging paradigm for energy-efficient design (642 citations)
  • Analyzing Volume Diagnosis Results with Statistical Learning for Yield Improvement (99 citations)
  • Test control for secure scan designs (97 citations)

Research areas of the most cited articles at European Test Symposium:

The most cited publications mainly deal with areas of study such as Embedded system, Electronic engineering, Automatic test pattern generation, System on a chip and Design for testing. Embedded system research presented in the most cited publications is mostly focused on the subject of Built-in self-test. The most cited papers facilitate discussions on Electronic engineering that incorporate concepts from other fields like Fault detection and isolation, Electronic circuit and Voltage.

What topics the last edition of the conference is best known for?

  • Operating system
  • Programming language
  • Electrical engineering

The previous edition focused in particular on these issues:

The primary areas of discussion in European Test Symposium are Electronic engineering, Embedded system, Reliability engineering, Electronic circuit and Automatic test pattern generation. The concepts on Electronic engineering presented in the event can also apply to other research fields, including Electrical engineering and Reliability (semiconductor). European Test Symposium emphasizes research on Embedded system, which includes concerns such as Field-programmable gate array.

The studies on Reliability engineering discussed can also contribute to research in the domains of Test (assessment), PCI Express, Very-large-scale integration, Reliability (statistics) and Automotive product. The presented Electronic circuit research focuses mostly on Testability and, on occasion, topics in Behavioral synthesis, Hierarchical test and Scheduling (computing). The research on Automatic test pattern generation featured in it combines topics in other fields like Test data, Parallel computing, Fault coverage and Test set.

The most cited articles from the last conference are:

  • A novel threshold voltage defined switch for circuit camouflaging (24 citations)
  • IoT: Source of test challenges (19 citations)
  • Cell-aware diagnosis: Defective inmates exposed in their cells (16 citations)

Papers citation over time

A key indicator for each conference is its effectiveness in reaching other researchers with the papers published at that venue.

The chart below presents the interquartile range (first quartile 25%, median 50% and third quartile 75%) of the number of citations of articles over time.

Research.com

The top authors publishing at European Test Symposium (based on the number of publications) are:

  • Alberto Bosio (18 papers) published 1 paper at the last edition the same number as at the previous edition,
  • Krishnendu Chakrabarty (17 papers) published 3 papers at the last edition, 1 less than at the previous edition,
  • Patrick Girard (17 papers) published 1 paper at the last edition the same number as at the previous edition,
  • Hans-Joachim Wunderlich (17 papers) published 2 papers at the last edition, 1 more than at the previous edition,
  • Arnaud Virazel (16 papers) published 1 paper at the last edition the same number as at the previous edition.

The overall trend for top authors publishing at this conference is outlined below. The chart shows the number of publications at each edition of the conference for top authors.

Research.com

Only papers with recognized affiliations are considered

The top affiliations publishing at European Test Symposium (based on the number of publications) are:

  • Mentor Graphics (22 papers) published 5 papers at the last edition, 4 more than at the previous edition,
  • Polytechnic University of Turin (19 papers) published 4 papers at the last edition the same number as at the previous edition,
  • Duke University (18 papers) published 3 papers at the last edition, 1 less than at the previous edition,
  • University of Stuttgart (17 papers) published 2 papers at the last edition, 1 more than at the previous edition,
  • NXP Semiconductors (17 papers) published 2 papers at the last edition the same number as at the previous edition.

The overall trend for top affiliations publishing at this conference is outlined below. The chart shows the number of publications at each edition of the conference for top affiliations.

Research.com

Publication chance based on affiliation

The publication chance index shows the ratio of articles published by the best research institutions at the conference edition to all articles published within that conference. The best research institutions were selected based on the largest number of articles published during all editions of the conference.

The chart below presents the percentage ratio of articles from top institutions (based on their ranking of total papers).Top affiliations were grouped by their rank into the following tiers: top 1-10, top 11-20, top 21-50, and top 51+. Only articles with a recognized affiliation are considered.

Research.com

During the most recent 2016 edition, 5.66% of publications had an unrecognized affiliation. Out of the publications with recognized affiliations, 36.00% were posted by at least one author from the top 10 institutions publishing at the conference. Another 14.00% included authors affiliated with research institutions from the top 11-20 affiliations. Institutions from the 21-50 range included 26.00% of all publications and 24.00% were from other institutions.

Returning Authors Index

A very common phenomenon observed among researchers publishing scientific articles is the intentional selection of conferences they have already attended in the past. In particular, it is worth analyzing the case when the authors participate in the same conference from year to year.

The Returning Authors Index presented below illustrates the ratio of authors who participated in both a given as well as the previous edition of the conference in relation to all participants in a given year.

Research.com

Returning Institution Index

The graph below shows the Returning Institution Index, illustrating the ratio of institutions that participated in both a given and the previous edition of the conference in relation to all affiliations present in a given year.

Research.com

The experience to innovation index

Our experience to innovation index was created to show a cross-section of the experience level of authors publishing at a conference. The index includes the authors publishing at the last edition of a conference, grouped by total number of publications throughout their academic career (P) and the total number of citations of these publications ever received (C).

The group intervals were selected empirically to best show the diversity of the authors' experiences, their labels were selected as a convenience, not as judgment. The authors were divided into the following groups:

  • Novice - P < 5 or C < 25 (the number of publications less than 5 or the number of citations less than 25),
  • Competent - P < 10 or C < 100 (the number of publications less than 10 or the number of citations less than 100),
  • Experienced - P < 25 or C < 625 (the number of publications less than 25 or the number of citations less than 625),
  • Master - P < 50 or C < 2500 (the number of publications less than 50 or the number of citations less than 2500),
  • Star - P ≥ 50 and C ≥ 2500 (both the number of publications greater than 50 and the number of citations greater than 2500).

Research.com

The chart below illustrates experience levels of first authors in cases of publications with multiple authors.

Research.com

Other Conferences in Italy

The Third International Nonlinear Dynamics Conference (NODYCON 2023)

Jun 18, 2023 - Jun 22, 2023

Rome , Italy, Italy

Deadline: Friday 07 Oct 2022

IEEE International Conference on Communications

May 28, 2023 - Jun 01, 2023

Rome , Italy, Italy

Deadline: Tuesday 11 Oct 2022

IEEE International Conference on Communications

May 28, 2023 - Jun 01, 2023

Rome , Italy, Italy

Deadline: Tuesday 11 Oct 2022

Previous Editions

ETS 2022 : IEEE European Test Symposium

May 23, 2022 - May 23, 2022

Barcelona , Spain, Spain

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