Ranking & Metrics Conference Call for Papers Other Conferences in United States
53rd European Solid-State Device Research Conference

53rd European Solid-State Device Research Conference

Lisbon , Portugal

Submission Deadline: Friday 14 Apr 2023

Conference Dates: Sep 11, 2023 - Sep 14, 2023

Research
Impact Score 1.40

OFFICIAL WEBSITE

Conference Organizers: Deadline extended?
Click here to edit

Ranking & Metrics Impact Score is a novel metric devised to rank conferences based on the number of contributing the best scientists in addition to the h-index estimated from the scientific papers published by the best scientists. See more details on our methodology page.

Research Impact Score: 1.40
Contributing Best Scientists: 26
H5-index:
Papers published by Best Scientists 31
Research Ranking (Electronics and Electrical Engineering) 64
Research Ranking (Materials Science) 20
Research Ranking (Physics) 46

Conference Call for Papers

ESSCIRC/ESSDERC encourages submissions in all areas with special emphasis on:



Joint tracks Circuits and Devices: Neuromorphic Computing, advanced memories, AI Accelerators, in-Memory-Computing, Security Advanced Computing Devices and Circuits: Advanced CMOS, post-CMOS, Quantum Computing Sensors, MEMS, Bioelectronics, Biomedical Optoelectronics, Display and Imaging



Analog circuits, Data converters, RF and mm-wave circuits, Frequency generation, Wireless and wireline systems, Power management



Analog, Power and RF devices, Electron Device Simulation and Modeling, Advanced Technology, Process and materials

Overview

Top Research Topics at European Solid-State Device Research Conference?

  • Optoelectronics (61.21%)
  • Electronic engineering (22.51%)
  • Silicon (20.63%)

The discussions in European Solid-State Device Research Conference mainly cover the fields of Optoelectronics, Electronic engineering, Silicon, Electrical engineering and Transistor. In European Solid-State Device Research Conference, Threshold voltage, Logic gate and MOSFET are investigated in conjunction with one another to address concerns in Optoelectronics research. The event focuses on MOSFET research which is adjacent to topics in Silicon on insulator.

Electronic circuit, Bipolar junction transistor, Dielectric and Silicon-germanium are some topics wherein Electronic engineering research discussed in it have an impact. Bipolar junction transistor and Heterojunction are closely related fields of research discussed in the event. The research on Silicon tackled can also make contributions to studies in the areas of Annealing (metallurgy), Epitaxy and Analytical chemistry.

Voltage is the primary subject of Electrical engineering works presented in the conference. Cmos process and Semiconductor device modeling are all aspects of CMOS research featured in it.

What are the most cited papers published at the conference?

  • Junctionless nanowire transistor (JNT): Properties and design guidelines (284 citations)
  • Junctionless nanowire transistor (JNT): Properties and design guidelines (158 citations)
  • Strongly directional emission from AlGaAs/GaAs light emitting diodes (112 citations)

Research areas of the most cited articles at European Solid-State Device Research Conference:

The conference articles mainly deal with areas of study such as Optoelectronics, Electronic engineering, Electrical engineering, CMOS and MOSFET. The studies on Optoelectronics discussed at the most cited papers can also contribute to research in the domains of Field-effect transistor and Transistor. The most cited papers hold forums on Electronic engineering that merge themes from other disciplines such as Threshold voltage, Non-volatile memory, Scaling and Voltage.

What topics the last edition of the conference is best known for?

  • Quantum mechanics
  • Electrical engineering
  • Electron

The previous edition focused in particular on these issues:

Optoelectronics, Electronic engineering, Logic gate, Transistor and Nanotechnology are the subjects of interest in European Solid-State Device Research Conference. European Solid-State Device Research Conference explores topics in Optoelectronics which can be helpful for research in disciplines like Electrical engineering and MOSFET. It primarily dealt with subjects of interest in Electronic engineering but also expanded the discussion to include studies in

  • Resistive random-access memory that intertwine with fields like Reset (computing),
  • Threshold voltage which intersects with area such as Semiconductor device modeling..

Aside from discussions in Logic gate, European Solid-State Device Research Conference also deals with the subject of Nanowire which intersects with Gallium arsenide disciplines. Research in Gallium nitride and the interrelating topic of High-electron-mobility transistor, Analytical chemistry and Schottky diode were among the subjects of interest in the Transistor studies discussed in it. The Nanotechnology works featured in the event incorporate elements from Field-effect transistor, Condensed matter physics and Electrode.

The most cited articles from the last conference are:

  • Cryogenic characterization of 28 nm bulk CMOS technology for quantum computing (42 citations)
  • Nanometer CMOS characterization and compact modeling at deep-cryogenic temperatures (25 citations)
  • Negative capacitance field effect transistors; capacitance matching and non-hysteretic operation (19 citations)

Papers citation over time

A key indicator for each conference is its effectiveness in reaching other researchers with the papers published at that venue.

The chart below presents the interquartile range (first quartile 25%, median 50% and third quartile 75%) of the number of citations of articles over time.

Research.com

The top authors publishing at European Solid-State Device Research Conference (based on the number of publications) are:

  • Adrian M. Ionescu (10 papers) published 3 papers at the last edition, 4 less than at the previous edition,
  • Gerard Ghibaudo (7 papers) published 1 paper at the last edition, 5 less than at the previous edition,
  • Jean-Pierre Raskin (7 papers) published 3 papers at the last edition, 1 less than at the previous edition,
  • Denis Flandre (6 papers) published 4 papers at the last edition, 2 more than at the previous edition,
  • Bertrand Parvais (5 papers) published 3 papers at the last edition, 1 more than at the previous edition.

The overall trend for top authors publishing at this conference is outlined below. The chart shows the number of publications at each edition of the conference for top authors.

Research.com

Only papers with recognized affiliations are considered

The top affiliations publishing at European Solid-State Device Research Conference (based on the number of publications) are:

  • STMicroelectronics (24 papers) published 6 papers at the last edition, 12 less than at the previous edition,
  • Katholieke Universiteit Leuven (20 papers) published 14 papers at the last edition, 8 more than at the previous edition,
  • École Polytechnique Fédérale de Lausanne (16 papers) published 6 papers at the last edition, 4 less than at the previous edition,
  • IBM (10 papers) published 3 papers at the last edition, 4 less than at the previous edition,
  • Université catholique de Louvain (9 papers) published 4 papers at the last edition, 1 less than at the previous edition.

The overall trend for top affiliations publishing at this conference is outlined below. The chart shows the number of publications at each edition of the conference for top affiliations.

Research.com

Publication chance based on affiliation

The publication chance index shows the ratio of articles published by the best research institutions at the conference edition to all articles published within that conference. The best research institutions were selected based on the largest number of articles published during all editions of the conference.

The chart below presents the percentage ratio of articles from top institutions (based on their ranking of total papers).Top affiliations were grouped by their rank into the following tiers: top 1-10, top 11-20, top 21-50, and top 51+. Only articles with a recognized affiliation are considered.

Research.com

During the most recent 2017 edition, 3.80% of publications had an unrecognized affiliation. Out of the publications with recognized affiliations, 43.42% were posted by at least one author from the top 10 institutions publishing at the conference. Another 13.16% included authors affiliated with research institutions from the top 11-20 affiliations. Institutions from the 21-50 range included 15.79% of all publications and 27.63% were from other institutions.

Returning Authors Index

A very common phenomenon observed among researchers publishing scientific articles is the intentional selection of conferences they have already attended in the past. In particular, it is worth analyzing the case when the authors participate in the same conference from year to year.

The Returning Authors Index presented below illustrates the ratio of authors who participated in both a given as well as the previous edition of the conference in relation to all participants in a given year.

Research.com

Returning Institution Index

The graph below shows the Returning Institution Index, illustrating the ratio of institutions that participated in both a given and the previous edition of the conference in relation to all affiliations present in a given year.

Research.com

The experience to innovation index

Our experience to innovation index was created to show a cross-section of the experience level of authors publishing at a conference. The index includes the authors publishing at the last edition of a conference, grouped by total number of publications throughout their academic career (P) and the total number of citations of these publications ever received (C).

The group intervals were selected empirically to best show the diversity of the authors' experiences, their labels were selected as a convenience, not as judgment. The authors were divided into the following groups:

  • Novice - P < 5 or C < 25 (the number of publications less than 5 or the number of citations less than 25),
  • Competent - P < 10 or C < 100 (the number of publications less than 10 or the number of citations less than 100),
  • Experienced - P < 25 or C < 625 (the number of publications less than 25 or the number of citations less than 625),
  • Master - P < 50 or C < 2500 (the number of publications less than 50 or the number of citations less than 2500),
  • Star - P ≥ 50 and C ≥ 2500 (both the number of publications greater than 50 and the number of citations greater than 2500).

Research.com

The chart below illustrates experience levels of first authors in cases of publications with multiple authors.

Research.com

Other Conferences in Portugal

49th  European Solid-State Circuits Conference

Sep 11, 2023 - Sep 14, 2023

Lisbon , Portugal, Portugal

Deadline: Friday 14 Apr 2023

32nd International Conference on Flexible Automation and Intelligent Manufacturing

Jun 18, 2023 - Jun 22, 2023

Porto , Portugal, Portugal

Deadline: Thursday 22 Dec 2022

Previous Editions

IEEE 51st European Solid-State Device Research Conference

Sep 13, 2021 - Sep 22, 2021

Online, Online

Something went wrong. Please try again later.