Design, Automation and Test in Europe Conference

Top Research Topics at Design, Automation, and Test in Europe?

• Embedded system (25.35%)
• Electronic engineering (16.48%)
• Parallel computing (10.25%)

The primary areas of discussion in Design, Automation, and Test in Europe are Embedded system, Electronic engineering, Parallel computing, Algorithm and Computer architecture. Embedded system research presented in Design, Automation, and Test in Europe encompasses a variety of subjects, including Software, Computer hardware and Multi-core processor. In it, Transistor and Electronic circuit, Electrical engineering are investigated in conjunction with one another to address concerns in Electronic engineering research.

Specifically, studies on Cache are prevalent in the Parallel computing works discussed.

What are the most cited papers published at the conference?

• A generic architecture for on-chip packet-switched interconnections (834 citations)
• ORION 2.0: a fast and accurate NoC power and area model for early-stage design space exploration (671 citations)
• BerkMin: A Fast and Robust Sat-Solver (642 citations)

Research areas of the most cited articles at Design, Automation, and Test in Europe:

The conference papers are organized to address concerns in the fields of Embedded system, Electronic engineering, System on a chip, Parallel computing and Integrated circuit design. The works on Embedded system tackled in the most cited papers bring together disciplines like Energy consumption, Computer architecture and Software. The conference papers address concerns in the field of Electronic engineering by exploring it in line with topics in Electronic circuit which intersect with Algorithm subjects.

What topics the last edition of the conference is best known for?

• Operating system
• Artificial intelligence
• Programming language

The previous edition focused in particular on these issues:

The conference aims to foster the development of research in Embedded system, Computer engineering, Artificial neural network, Artificial intelligence and Distributed computing. More specifically, the research on Embedded system in the event is related to Field-programmable gate array. Design, Automation, and Test in Europe holds forums on Computer engineering that merges themes from other disciplines such as Process (computing) and Computation.

The study on Artificial neural network presented in the conference intersects with subjects under the field of Algorithm. Many of the studies tackled connect Artificial intelligence with a similar field of study like Machine learning. Studies in Distributed computing and Resource management are the key highlights in the conference.

The most cited articles from the last conference are:

• Functional Analysis Attacks on Logic Locking (52 citations)
• Design of Reliable DNN Accelerator with Un-reliable ReRAM (44 citations)
• Deep Positron: A Deep Neural Network Using the Posit Number System (42 citations)

Papers citation over time

A key indicator for each conference is its effectiveness in reaching other researchers with the papers published at that venue.

The chart below presents the interquartile range (first quartile 25%, median 50% and third quartile 75%) of the number of citations of articles over time.

Top authors and change over time

The top authors publishing at Design, Automation, and Test in Europe (based on the number of publications) are:

• Luca Benini (67 papers) published 7 papers at the last edition, 1 more than at the previous edition,
• Jorg Henkel (57 papers) published 7 papers at the last edition, 2 more than at the previous edition,
• Muhammad Shafique (46 papers) published 6 papers at the last edition, 1 more than at the previous edition,
• Giovanni De Micheli (43 papers) published 4 papers at the last edition, 1 more than at the previous edition,
• Massoud Pedram (36 papers) published 2 papers at the last edition, 1 less than at the previous edition.

The overall trend for top authors publishing at this conference is outlined below. The chart shows the number of publications at each edition of the conference for top authors.

Top affiliations and change over time

Only papers with recognized affiliations are considered

The top affiliations publishing at Design, Automation, and Test in Europe (based on the number of publications) are:

• École Polytechnique Fédérale de Lausanne (110 papers) published 9 papers at the last edition the same number as at the previous edition,
• Karlsruhe Institute of Technology (108 papers) published 11 papers at the last edition, 1 less than at the previous edition,
• Polytechnic University of Turin (84 papers) published 6 papers at the last edition, 2 more than at the previous edition,
• Technische Universität München (80 papers) published 10 papers at the last edition, 1 more than at the previous edition,
• Katholieke Universiteit Leuven (79 papers) published 6 papers at the last edition, 1 more than at the previous edition.

The overall trend for top affiliations publishing at this conference is outlined below. The chart shows the number of publications at each edition of the conference for top affiliations.

Publication chance based on affiliation

The publication chance index shows the ratio of articles published by the best research institutions at the conference edition to all articles published within that conference. The best research institutions were selected based on the largest number of articles published during all editions of the conference.

The chart below presents the percentage ratio of articles from top institutions (based on their ranking of total papers).Top affiliations were grouped by their rank into the following tiers: top 1-10, top 11-20, top 21-50, and top 51+. Only articles with a recognized affiliation are considered.

During the most recent 2019 edition, 1.79% of publications had an unrecognized affiliation. Out of the publications with recognized affiliations, 19.45% were posted by at least one author from the top 10 institutions publishing at the conference. Another 10.33% included authors affiliated with research institutions from the top 11-20 affiliations. Institutions from the 21-50 range included 21.58% of all publications and 48.63% were from other institutions.

Returning Authors Index

A very common phenomenon observed among researchers publishing scientific articles is the intentional selection of conferences they have already attended in the past. In particular, it is worth analyzing the case when the authors participate in the same conference from year to year.

The Returning Authors Index presented below illustrates the ratio of authors who participated in both a given as well as the previous edition of the conference in relation to all participants in a given year.

Returning Institution Index

The graph below shows the Returning Institution Index, illustrating the ratio of institutions that participated in both a given and the previous edition of the conference in relation to all affiliations present in a given year.

The experience to innovation index

Our experience to innovation index was created to show a cross-section of the experience level of authors publishing at a conference. The index includes the authors publishing at the last edition of a conference, grouped by total number of publications throughout their academic career (P) and the total number of citations of these publications ever received (C).

The group intervals were selected empirically to best show the diversity of the authors' experiences, their labels were selected as a convenience, not as judgment. The authors were divided into the following groups:

• Novice - P < 5 or C < 25 (the number of publications less than 5 or the number of citations less than 25),
• Competent - P < 10 or C < 100 (the number of publications less than 10 or the number of citations less than 100),
• Experienced - P < 25 or C < 625 (the number of publications less than 25 or the number of citations less than 625),
• Master - P < 50 or C < 2500 (the number of publications less than 50 or the number of citations less than 2500),
• Star - P ≥ 50 and C ≥ 2500 (both the number of publications greater than 50 and the number of citations greater than 2500).

The chart below illustrates experience levels of first authors in cases of publications with multiple authors.