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Design, Automation and Test in Europe Conference

Design, Automation and Test in Europe Conference

Antwerp , Belgium

Submission Deadline: Sunday 18 Sep 2022

Conference Dates: Apr 17, 2023 - Apr 19, 2023

Research
Impact Score 5.10

OFFICIAL WEBSITE

Conference Organizers: Deadline extended?
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Ranking & Metrics Impact Score is a novel metric devised to rank conferences based on the number of contributing the best scientists in addition to the h-index estimated from the scientific papers published by the best scientists. See more details on our methodology page.

Research Impact Score: 5.10
Contributing Best Scientists: 92
H5-index:
Papers published by Best Scientists 214
Research Ranking (Computer Science) 84
Research Ranking (Electronics and Electrical Engineering) 8

Conference Call for Papers

Within the scope of the conference, the main areas of interest are organised in the following tracks. Submissions can be made to any of the track topics.

Track D: Design Methods and Tools, addresses design automation, design tools and hardware architectures for electronic and embedded systems. The emphasis is on methods, algorithms and tools related to the use of computers in designing complete systems. The track focus includes significant improvements on existing design methods and tools as well as forward-looking approaches to model and design future system architectures, design flows and environments.

This track is organised in the following topics:

D1 System Specification and Modelling, Click here for details
D2 System-Level Design Methodologies and High-Level- Synthesis, Click here for details
D3 System Simulation and Validation, Click here for details
DT4 Design and Test for Analogue and Mixed-Signal Circuits and Systems, and MEMS, Click here for details
DT5 Design and Test of Hardware Security Primitives, Click here for details
DT6 Design and Test of Secure Systems, Click here for details
D7 Formal Methods and Verification, Click here for details
D8 Network-on-Chip and on-chip communication, Click here for details
D9 Architectural and Microarchitectural Design, Click here for details
D10 Low-power, Energy-efficient and Thermal-aware Design, Click here for details
D11 Approximate Computing, Click here for details
D12 Reconfigurable Systems, Click here for details
D13 Logical and Physical Analysis and Design, Click here for details
D14 Emerging Design Technologies for Future Computing, Click here for details
D15 Emerging Design Technologies for Future Memories, Click here for details
Track A: Application Design, is devoted to the presentation and discussion of design experiences with a high degree of industrial relevance, real-world implementations and applications of specific design and test methodologies. Contributions should illustrate innovative or record-breaking design and test methodologies, which will provide viable solutions in tomorrow’s silicon, embedded systems and large-scale systems. In topic A8, there is the opportunity to submit 2-page papers that expose industrial research and practice.

This track is organised in the following topics:

A1 Power-efficient and Sustainable Computing, Click here for details
A2 Smart Cities, Internet of Everything, Industry 4.0, Click here for details
A3 Automotive Systems and Smart Energy Systems, Click here for details
A4 Augmented Living and Personalised Healthcare, Click here for details
A5 Secure Systems, Circuits, and Architectures, Click here for details
A6 Self-adaptive and Context-aware Systems, Click here for details
A7 Applications of Emerging Technologies, Click here for details
A8 Industrial Experiences Brief Papers, Click here for details
Track T: Test and Dependability, covers all test, design-for-test, reliability and design-for-robustness issues, at system-, chip-, circuit- and device-level for both analogue and digital electronics. Topics of interest also include diagnosis, failure mode analysis, debug and post-silicon validation challenges and test or fault injection methods addressing system security.

This track is organised in the following topics:

T1 Modelling and Mitigation of Defects, Faults, Variability, and Reliability, Click here for details
T2 Test Generation, Test Architectures, Design for Test, and Diagnosis, Click here for details
T3 Dependability and System-Level Test, Click here for details
DT4 Design and Test for Analogue and Mixed-Signal Circuits and Systems, and MEMS, Click here for details
DT5 Design and Test of Hardware Security Primitives, Click here for details
DT6 Design and Test of Secure Systems, Click here for details
Track E: Embedded Systems Design, is devoted to the modelling, analysis, design, verification and deployment of embedded software or embedded/cyber-physical systems. Areas of interest include methods, tools, methodologies and development environments for real-time systems, cyber-physical systems, networked systems and dependable systems. Emphasis is, also, on model-based design and verification, embedded software platforms, software compilation and integration for these systems.

This track is organised in the following topics:

E1 Embedded Software Architecture, Compilers and Tool Chains, Click here for details
E2 Real-time, Dependable and Privacy-Enhanced Systems, Click here for details
E3 Machine Learning Solutions for Embedded and Cyber-Physical Systems, Click here for details
E4 Design Methodologies for Machine Learning Architectures, Click here for details
E5 Design Modelling and Verification for Embedded and Cyber-Physical Systems, Click here for details

Overview

Top Research Topics at Design, Automation, and Test in Europe?

  • Embedded system (25.35%)
  • Electronic engineering (16.48%)
  • Parallel computing (10.25%)

The primary areas of discussion in Design, Automation, and Test in Europe are Embedded system, Electronic engineering, Parallel computing, Algorithm and Computer architecture. Embedded system research presented in Design, Automation, and Test in Europe encompasses a variety of subjects, including Software, Computer hardware and Multi-core processor. In it, Transistor and Electronic circuit, Electrical engineering are investigated in conjunction with one another to address concerns in Electronic engineering research.

Specifically, studies on Cache are prevalent in the Parallel computing works discussed.

What are the most cited papers published at the conference?

  • A generic architecture for on-chip packet-switched interconnections (834 citations)
  • ORION 2.0: a fast and accurate NoC power and area model for early-stage design space exploration (671 citations)
  • BerkMin: A Fast and Robust Sat-Solver (642 citations)

Research areas of the most cited articles at Design, Automation, and Test in Europe:

The conference papers are organized to address concerns in the fields of Embedded system, Electronic engineering, System on a chip, Parallel computing and Integrated circuit design. The works on Embedded system tackled in the most cited papers bring together disciplines like Energy consumption, Computer architecture and Software. The conference papers address concerns in the field of Electronic engineering by exploring it in line with topics in Electronic circuit which intersect with Algorithm subjects.

What topics the last edition of the conference is best known for?

  • Operating system
  • Artificial intelligence
  • Programming language

The previous edition focused in particular on these issues:

The conference aims to foster the development of research in Embedded system, Computer engineering, Artificial neural network, Artificial intelligence and Distributed computing. More specifically, the research on Embedded system in the event is related to Field-programmable gate array. Design, Automation, and Test in Europe holds forums on Computer engineering that merges themes from other disciplines such as Process (computing) and Computation.

The study on Artificial neural network presented in the conference intersects with subjects under the field of Algorithm. Many of the studies tackled connect Artificial intelligence with a similar field of study like Machine learning. Studies in Distributed computing and Resource management are the key highlights in the conference.

The most cited articles from the last conference are:

  • Functional Analysis Attacks on Logic Locking (52 citations)
  • Design of Reliable DNN Accelerator with Un-reliable ReRAM (44 citations)
  • Deep Positron: A Deep Neural Network Using the Posit Number System (42 citations)

Papers citation over time

A key indicator for each conference is its effectiveness in reaching other researchers with the papers published at that venue.

The chart below presents the interquartile range (first quartile 25%, median 50% and third quartile 75%) of the number of citations of articles over time.

Research.com

The top authors publishing at Design, Automation, and Test in Europe (based on the number of publications) are:

  • Luca Benini (67 papers) published 7 papers at the last edition, 1 more than at the previous edition,
  • Jorg Henkel (57 papers) published 7 papers at the last edition, 2 more than at the previous edition,
  • Muhammad Shafique (46 papers) published 6 papers at the last edition, 1 more than at the previous edition,
  • Giovanni De Micheli (43 papers) published 4 papers at the last edition, 1 more than at the previous edition,
  • Massoud Pedram (36 papers) published 2 papers at the last edition, 1 less than at the previous edition.

The overall trend for top authors publishing at this conference is outlined below. The chart shows the number of publications at each edition of the conference for top authors.

Research.com

Only papers with recognized affiliations are considered

The top affiliations publishing at Design, Automation, and Test in Europe (based on the number of publications) are:

  • École Polytechnique Fédérale de Lausanne (110 papers) published 9 papers at the last edition the same number as at the previous edition,
  • Karlsruhe Institute of Technology (108 papers) published 11 papers at the last edition, 1 less than at the previous edition,
  • Polytechnic University of Turin (84 papers) published 6 papers at the last edition, 2 more than at the previous edition,
  • Technische Universität München (80 papers) published 10 papers at the last edition, 1 more than at the previous edition,
  • Katholieke Universiteit Leuven (79 papers) published 6 papers at the last edition, 1 more than at the previous edition.

The overall trend for top affiliations publishing at this conference is outlined below. The chart shows the number of publications at each edition of the conference for top affiliations.

Research.com

Publication chance based on affiliation

The publication chance index shows the ratio of articles published by the best research institutions at the conference edition to all articles published within that conference. The best research institutions were selected based on the largest number of articles published during all editions of the conference.

The chart below presents the percentage ratio of articles from top institutions (based on their ranking of total papers).Top affiliations were grouped by their rank into the following tiers: top 1-10, top 11-20, top 21-50, and top 51+. Only articles with a recognized affiliation are considered.

Research.com

During the most recent 2019 edition, 1.79% of publications had an unrecognized affiliation. Out of the publications with recognized affiliations, 19.45% were posted by at least one author from the top 10 institutions publishing at the conference. Another 10.33% included authors affiliated with research institutions from the top 11-20 affiliations. Institutions from the 21-50 range included 21.58% of all publications and 48.63% were from other institutions.

Returning Authors Index

A very common phenomenon observed among researchers publishing scientific articles is the intentional selection of conferences they have already attended in the past. In particular, it is worth analyzing the case when the authors participate in the same conference from year to year.

The Returning Authors Index presented below illustrates the ratio of authors who participated in both a given as well as the previous edition of the conference in relation to all participants in a given year.

Research.com

Returning Institution Index

The graph below shows the Returning Institution Index, illustrating the ratio of institutions that participated in both a given and the previous edition of the conference in relation to all affiliations present in a given year.

Research.com

The experience to innovation index

Our experience to innovation index was created to show a cross-section of the experience level of authors publishing at a conference. The index includes the authors publishing at the last edition of a conference, grouped by total number of publications throughout their academic career (P) and the total number of citations of these publications ever received (C).

The group intervals were selected empirically to best show the diversity of the authors' experiences, their labels were selected as a convenience, not as judgment. The authors were divided into the following groups:

  • Novice - P < 5 or C < 25 (the number of publications less than 5 or the number of citations less than 25),
  • Competent - P < 10 or C < 100 (the number of publications less than 10 or the number of citations less than 100),
  • Experienced - P < 25 or C < 625 (the number of publications less than 25 or the number of citations less than 625),
  • Master - P < 50 or C < 2500 (the number of publications less than 50 or the number of citations less than 2500),
  • Star - P ≥ 50 and C ≥ 2500 (both the number of publications greater than 50 and the number of citations greater than 2500).

Research.com

The chart below illustrates experience levels of first authors in cases of publications with multiple authors.

Research.com

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