Submission Deadline: Sunday 18 Sep 2022
Conference Dates: Apr 17, 2023 - Apr 19, 2023
The primary areas of discussion in Design, Automation, and Test in Europe are Embedded system, Electronic engineering, Parallel computing, Algorithm and Computer architecture. Embedded system research presented in Design, Automation, and Test in Europe encompasses a variety of subjects, including Software, Computer hardware and Multi-core processor. In it, Transistor and Electronic circuit, Electrical engineering are investigated in conjunction with one another to address concerns in Electronic engineering research.
Specifically, studies on Cache are prevalent in the Parallel computing works discussed.
The conference papers are organized to address concerns in the fields of Embedded system, Electronic engineering, System on a chip, Parallel computing and Integrated circuit design. The works on Embedded system tackled in the most cited papers bring together disciplines like Energy consumption, Computer architecture and Software. The conference papers address concerns in the field of Electronic engineering by exploring it in line with topics in Electronic circuit which intersect with Algorithm subjects.
The conference aims to foster the development of research in Embedded system, Computer engineering, Artificial neural network, Artificial intelligence and Distributed computing. More specifically, the research on Embedded system in the event is related to Field-programmable gate array. Design, Automation, and Test in Europe holds forums on Computer engineering that merges themes from other disciplines such as Process (computing) and Computation.
The study on Artificial neural network presented in the conference intersects with subjects under the field of Algorithm. Many of the studies tackled connect Artificial intelligence with a similar field of study like Machine learning. Studies in Distributed computing and Resource management are the key highlights in the conference.
A key indicator for each conference is its effectiveness in reaching other researchers with the papers published at that venue.
The chart below presents the interquartile range (first quartile 25%, median 50% and third quartile 75%) of the number of citations of articles over time.
The top authors publishing at Design, Automation, and Test in Europe (based on the number of publications) are:
The overall trend for top authors publishing at this conference is outlined below. The chart shows the number of publications at each edition of the conference for top authors.
Only papers with recognized affiliations are considered
The top affiliations publishing at Design, Automation, and Test in Europe (based on the number of publications) are:
The overall trend for top affiliations publishing at this conference is outlined below. The chart shows the number of publications at each edition of the conference for top affiliations.
The publication chance index shows the ratio of articles published by the best research institutions at the conference edition to all articles published within that conference. The best research institutions were selected based on the largest number of articles published during all editions of the conference.
The chart below presents the percentage ratio of articles from top institutions (based on their ranking of total papers).Top affiliations were grouped by their rank into the following tiers: top 1-10, top 11-20, top 21-50, and top 51+. Only articles with a recognized affiliation are considered.
During the most recent 2019 edition, 1.79% of publications had an unrecognized affiliation. Out of the publications with recognized affiliations, 19.45% were posted by at least one author from the top 10 institutions publishing at the conference. Another 10.33% included authors affiliated with research institutions from the top 11-20 affiliations. Institutions from the 21-50 range included 21.58% of all publications and 48.63% were from other institutions.
A very common phenomenon observed among researchers publishing scientific articles is the intentional selection of conferences they have already attended in the past. In particular, it is worth analyzing the case when the authors participate in the same conference from year to year.
The Returning Authors Index presented below illustrates the ratio of authors who participated in both a given as well as the previous edition of the conference in relation to all participants in a given year.
The graph below shows the Returning Institution Index, illustrating the ratio of institutions that participated in both a given and the previous edition of the conference in relation to all affiliations present in a given year.
Our experience to innovation index was created to show a cross-section of the experience level of authors publishing at a conference. The index includes the authors publishing at the last edition of a conference, grouped by total number of publications throughout their academic career (P) and the total number of citations of these publications ever received (C).
The group intervals were selected empirically to best show the diversity of the authors' experiences, their labels were selected as a convenience, not as judgment. The authors were divided into the following groups:
The chart below illustrates experience levels of first authors in cases of publications with multiple authors.
Apr 08, 2024 - Apr 11, 2024
Deadline: Friday 29 Sep 2023
Mar 14, 2022 - Mar 14, 2022
Apr 17, 2023 - Apr 19, 2023
Design, Automation and Test in Europe Conference
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