Submission Deadline: Friday 04 Nov 2022
Conference Dates: Jun 18, 2023 - Jun 22, 2023
The conference focuses on Artificial intelligence, Computer vision, Pattern recognition, Feature extraction and Machine learning. The study on Artificial intelligence presented in Computer Vision and Pattern Recognition intersects with subjects under the field of Algorithm. Many of the studies tackled connect Computer vision with a similar field of study like Robustness (computer science).
The concepts on Pattern recognition presented in Computer Vision and Pattern Recognition can also apply to other research fields, including Contextual image classification, Facial recognition system and Feature (computer vision). The featured Facial recognition system research is covered under the field of Face (geometry). The studies tackled, which mainly focus on Feature extraction, apply to Visualization as well.
The conference centers on topics in Machine learning, with a focus on Deep learning. The presentations discussing Image segmentation offer insights in topics such as Scale-space segmentation and Segmentation-based object categorization. Most of the Convolutional neural network studies addressed also intersect with Artificial neural network.
The conference articles mainly deal with areas of study such as Artificial intelligence, Pattern recognition, Computer vision, Feature extraction and Machine learning. The Artificial intelligence research presented in the published papers places emphasis on topics like Image segmentation, Object detection, Segmentation, Contextual image classification and Convolutional neural network. The most cited papers address concerns in Pattern recognition which are intertwined with other disciplines, such as Artificial neural network, Facial recognition system, Cognitive neuroscience of visual object recognition and Feature (computer vision).
The foci of the conference are Artificial intelligence, Computer vision, Pattern recognition, Image (mathematics) and Machine learning. It links adjacent topics like Artificial intelligence with Code (cryptography). In the event, Frame (networking) and Representation (mathematics) are investigated in conjunction with one another to address concerns in Computer vision research.
The concepts on Pattern recognition presented in Computer Vision and Pattern Recognition can also apply to other research fields, including Domain (software engineering), Feature (computer vision) and Benchmark (computing). Machine learning research featured in the conference incorporates concerns from various other topics such as Generalization and Task (project management). Artificial neural network and Algorithm are closely related fields of research discussed in the event.
A key indicator for each conference is its effectiveness in reaching other researchers with the papers published at that venue.
The chart below presents the interquartile range (first quartile 25%, median 50% and third quartile 75%) of the number of citations of articles over time.
The top authors publishing at Computer Vision and Pattern Recognition (based on the number of publications) are:
The overall trend for top authors publishing at this conference is outlined below. The chart shows the number of publications at each edition of the conference for top authors.
Only papers with recognized affiliations are considered
The top affiliations publishing at Computer Vision and Pattern Recognition (based on the number of publications) are:
The overall trend for top affiliations publishing at this conference is outlined below. The chart shows the number of publications at each edition of the conference for top affiliations.
The publication chance index shows the ratio of articles published by the best research institutions at the conference edition to all articles published within that conference. The best research institutions were selected based on the largest number of articles published during all editions of the conference.
The chart below presents the percentage ratio of articles from top institutions (based on their ranking of total papers).Top affiliations were grouped by their rank into the following tiers: top 1-10, top 11-20, top 21-50, and top 51+. Only articles with a recognized affiliation are considered.
During the most recent 2021 edition, 3.28% of publications had an unrecognized affiliation. Out of the publications with recognized affiliations, 27.47% were posted by at least one author from the top 10 institutions publishing at the conference. Another 12.14% included authors affiliated with research institutions from the top 11-20 affiliations. Institutions from the 21-50 range included 21.38% of all publications and 39.02% were from other institutions.
A very common phenomenon observed among researchers publishing scientific articles is the intentional selection of conferences they have already attended in the past. In particular, it is worth analyzing the case when the authors participate in the same conference from year to year.
The Returning Authors Index presented below illustrates the ratio of authors who participated in both a given as well as the previous edition of the conference in relation to all participants in a given year.
The graph below shows the Returning Institution Index, illustrating the ratio of institutions that participated in both a given and the previous edition of the conference in relation to all affiliations present in a given year.
Our experience to innovation index was created to show a cross-section of the experience level of authors publishing at a conference. The index includes the authors publishing at the last edition of a conference, grouped by total number of publications throughout their academic career (P) and the total number of citations of these publications ever received (C).
The group intervals were selected empirically to best show the diversity of the authors' experiences, their labels were selected as a convenience, not as judgment. The authors were divided into the following groups:
The chart below illustrates experience levels of first authors in cases of publications with multiple authors.
Jun 21, 2022 - Jun 21, 2022
New Orleans, United States
Jun 18, 2023 - Jun 22, 2023
Jun 18, 2023 - Jun 22, 2023
34th IEEE/CVF Conference on Computer Vision and Pattern Recognition
Thank you for information!