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Compact (EUV and X-Ray) Light Sources (EUVXRAY)

Compact (EUV and X-Ray) Light Sources (EUVXRAY)

Budapest, Hungary

Submission Deadline: Tuesday 21 Dec 2021

Conference Dates: Mar 23, 2022 - Mar 25, 2022

Research
Impact Score 0.20

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Ranking & Metrics Impact Score is a novel metric devised to rank conferences based on the number of contributing the best scientists in addition to the h-index estimated from the scientific papers published by the best scientists. See more details on our methodology page.

Research Impact Score: 0.20
Contributing Best Scientists: 6
H5-index:
Papers published by Best Scientists 7
Research Ranking (Physics) 93

Conference Call for Papers

Topic Categories
EUV through hard-x-ray sources and components
Compact sources
Compact Free-electron lasers
Inverse Compton scattering sources
Laser and discharge produced plasma sources
X-ray laser sources
High-harmonic generation sources
High power lasers beam diagnostics tools
Radio frequency cavities, and guns
Undulators and wigglers (including permanent magnet, short-period microwave and THz undulators, superconducting devices)
Magnets and multiband achromats
Vacuum chambers and components
Others
Applications
EUV lithography and mask inspection
Semiconductor wafer inspection and metrology
Phase contrast imaging and tomography
Medical and clinical imaging
Biological imaging
Macromolecular crystallography
Cultural heritage studies
Non-destructive testing
Ultrafast and dynamic studies
Wide field imaging
Others
Enabling technologies such as optics, detectors, beam wavefront diagnostic tools, and other instruments
Data acquisition, management, and processing

Previous Editions

Compact (EUV and X-Ray) Light Sources (EUVXRAY)

Mar 23, 2022 - Mar 25, 2022

Budapest, Hungary

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